Sébastien Kerdilès

According to our database, Sébastien Kerdilès authored at least 5 papers between 2012 and 2025.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2025

Enhanced Ferroelectricity in Hf_0.5Zr_.5O₂ Thin Films by NLA at Intermediate Laser Energy Density.

David Lehninger, Tianren Zhang, Peter Reinig, Justine Barbot, Mathieu Opprecht, Sébastien Kerdilès, Laurent Grenouillet, Konrad Seidel, Maximilian Lederer

Proceedings of the International Conference on IC Design and Technology, 2025

2024

Breakthrough Processes for Si CMOS Devices with BEOL Compatibility for 3D Sequential Integrated more than Moore Analog Applications.

Daphnée Bosch, Abygaël Viey, Tadeu Mota Frutuoso, P. Lheritier, C. Licitra, Nada Zerhouni, A. Albouy, Laurent Brunet, A. Magalhaes-Lucas, L. M. B. da Silva, H. Boutry, M. Husien Fahmy Taha Abdelrahman, F. Cristiano, R. Gassilloud, M. Ribotta, G. Romano, William Vandendaele, V. Benevent, Mathieu Opprecht, S. Kerdilès, F. Milesi, F. Mazen, Benoit Sklénard, C. Euvrard-Colnat, Johannes Sturm, A. Lambert, C. Candebage, L. Laraignou, F. Boulard, A. Sarrazin, M. De Souza, Christoforos G. Theodorou, Xavier Garros, Perrine Batude

Proceedings of the IEEE Symposium on VLSI Technology and Circuits 2024, 2024

2023

Reliability assessment of hafnia-based ferroelectric devices and arrays for memory and AI applications (Invited).

Laurent Grenouillet, Justine Barbot, J. Laguerre, Simon Martin, Catherine Carabasse, M. Louro, Messaoud Bedjaoui, S. Minoret, S. Kerdilès, C. Boixaderas, Thomas Magis, Carine Jahan, François Andrieu, Jean Coignus

Proceedings of the IEEE International Reliability Physics Symposium, 2023

2022

Study of Nanosecond Laser Annealing on Silicon Doped Hafnium Oxide Film Crystallization and Capacitor Reliability.

Tarek Ali, Ricardo Olivo, S. Kerdilès, David Lehninger, Maximilian Lederer, Sourav De, A.-S. Royet, Ayse Sünbül, A. Prabhu, Kati Kühnel, Malte Czernohorsky, M. Rudolph, Raik Hoffmann, Christelle Charpin-Nicolle, Laurent Grenouillet, Thomas Kämpfe, Konrad Seidel

Proceedings of the IEEE International Memory Workshop, 2022

2012

Strained silicon on insulator substrates for fully depleted application.

Walter Schwarzenbach, N. Daval, S. Kerdilès, G. Chabanne, C. Figuet, S. Guerroudj, O. Bonnin, X. Cauchy, Bich-Yen Nguyen, Christophe Maleville

Proceedings of the IEEE International Conference on IC Design & Technology, 2012