Juan-David Guerrero-Balaguera
Orcid: 0000-0001-6852-2372
According to our database1,
Juan-David Guerrero-Balaguera
authored at least 19 papers
between 2021 and 2023.
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Bibliography
2023
Analyzing the Impact of Different Real Number Formats on the Structural Reliability of TCUs in GPUs.
Proceedings of the 31st IFIP/IEEE International Conference on Very Large Scale Integration, 2023
Understanding the Effects of Permanent Faults in GPU's Parallelism Management and Control Units.
Proceedings of the International Conference for High Performance Computing, 2023
Proceedings of the 24th IEEE Latin American Test Symposium, 2023
Proceedings of the 32nd IEEE International Symposium on Industrial Electronics, 2023
Proceedings of the IEEE European Test Symposium, 2023
Proceedings of the 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, 2023
2022
A New Method to Generate Software Test Libraries for In-Field GPU Testing Resorting to High-Level Languages.
Proceedings of the 40th IEEE VLSI Test Symposium, 2022
A Multi-level Approach to Evaluate the Impact of GPU Permanent Faults on CNN's Reliability.
Proceedings of the IEEE International Test Conference, 2022
Proceedings of the IEEE International Test Conference in Asia, 2022
Reliability Assessment of Neural Networks in GPUs: A Framework For Permanent Faults Injections.
Proceedings of the 31st IEEE International Symposium on Industrial Electronics, 2022
Effective fault simulation of GPU's permanent faults for reliability estimation of CNNs.
Proceedings of the 28th IEEE International Symposium on On-Line Testing and Robust System Design, 2022
Neural Network's Reliability to Permanent Faults: Analyzing the Impact of Performance Optimizations in GPUs.
Proceedings of the 29th IEEE International Conference on Electronics, Circuits and Systems, 2022
Proceedings of the 2022 Design, Automation & Test in Europe Conference & Exhibition, 2022
2021
Proceedings of the 28th IEEE International Conference on Electronics, 2021
Proceedings of the 24th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2021
Proceedings of the 30th IEEE Asian Test Symposium, 2021