Juan-David Guerrero-Balaguera

Orcid: 0000-0001-6852-2372

According to our database1, Juan-David Guerrero-Balaguera authored at least 19 papers between 2021 and 2023.

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Bibliography

2023
STLs for GPUs: Using High-Level Language Approaches.
IEEE Des. Test, August, 2023

Using STLs for Effective In-Field Test of GPUs.
IEEE Des. Test, April, 2023

Analyzing the Impact of Different Real Number Formats on the Structural Reliability of TCUs in GPUs.
Proceedings of the 31st IFIP/IEEE International Conference on Very Large Scale Integration, 2023

Understanding the Effects of Permanent Faults in GPU's Parallelism Management and Control Units.
Proceedings of the International Conference for High Performance Computing, 2023

Analyzing the Architectural Impact of Transient Fault Effects in SFUs of GPUs.
Proceedings of the 24th IEEE Latin American Test Symposium, 2023

Reliability Estimation of Split DNN Models for Distributed Computing in IoT Systems.
Proceedings of the 32nd IEEE International Symposium on Industrial Electronics, 2023

Evaluating the Prevalence of SFUs in the Reliability of GPUs.
Proceedings of the IEEE European Test Symposium, 2023

A Reliability-aware Environment for Design Exploration for GPU Devices.
Proceedings of the 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, 2023

2022
Characterizing a Neutron-Induced Fault Model for Deep Neural Networks.
CoRR, 2022

A New Method to Generate Software Test Libraries for In-Field GPU Testing Resorting to High-Level Languages.
Proceedings of the 40th IEEE VLSI Test Symposium, 2022

A Multi-level Approach to Evaluate the Impact of GPU Permanent Faults on CNN's Reliability.
Proceedings of the IEEE International Test Conference, 2022

Evaluating the impact of Permanent Faults in a GPU running a Deep Neural Network.
Proceedings of the IEEE International Test Conference in Asia, 2022

Reliability Assessment of Neural Networks in GPUs: A Framework For Permanent Faults Injections.
Proceedings of the 31st IEEE International Symposium on Industrial Electronics, 2022

Effective fault simulation of GPU's permanent faults for reliability estimation of CNNs.
Proceedings of the 28th IEEE International Symposium on On-Line Testing and Robust System Design, 2022

Neural Network's Reliability to Permanent Faults: Analyzing the Impact of Performance Optimizations in GPUs.
Proceedings of the 29th IEEE International Conference on Electronics, Circuits and Systems, 2022

A Compaction Method for STLs for GPU in-field test.
Proceedings of the 2022 Design, Automation & Test in Europe Conference & Exhibition, 2022

2021
Using Hardware Performance Counters to support infield GPU Testing.
Proceedings of the 28th IEEE International Conference on Electronics, 2021

On the Functional Test of Special Function Units in GPUs.
Proceedings of the 24th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2021

A Novel Compaction Approach for SBST Test Programs.
Proceedings of the 30th IEEE Asian Test Symposium, 2021


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