Robert Limas Sierra
Orcid: 0000-0001-5206-3757
According to our database1,
Robert Limas Sierra authored at least 21 papers
between 2022 and 2026.
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Bibliography
2026
Reliability Assessment of Deep Neural Networks and Accelerators Across Design Stages.
Proceedings of the 27th IEEE Latin American Test Symposium, 2026
Analyzing Hardware Accelerators' Reliability: From Design Exploration to Fast Evaluation with Hyperscalers.
Proceedings of the 17th IEEE Latin America Symposium on Circuits and System, 2026
2025
Investigating and Mitigating Critical Faults in Floating-Point and Posit Arithmetic Hardware.
IEEE Trans. Emerg. Top. Comput., 2025
SHADOWFI: An Open-Source Framework for Fault Evaluation of Complex IC Designs Using Hyperscale Computing.
IEEE Access, 2025
Proceedings of the 26th IEEE Latin American Test Symposium, 2025
Proceedings of the 26th IEEE Latin American Test Symposium, 2025
Proceedings of the 26th IEEE Latin American Test Symposium, 2025
2024
Investigating and Reducing the Architectural Impact of Transient Faults in Special Function Units for GPUs.
J. Electron. Test., April, 2024
Analyzing the Impact of Scheduling Policies on the Reliability of GPUs Running CNN Operations.
Proceedings of the 42nd IEEE VLSI Test Symposium, 2024
Proceedings of the 42nd IEEE VLSI Test Symposium, 2024
Proceedings of the 32nd IFIP/IEEE International Conference on Very Large Scale Integration, 2024
Proceedings of the 30th IEEE International Symposium on On-Line Testing and Robust System Design, 2024
Analyzing the Structural and Operational Impact of Faults in Floating-Point and Posit Arithmetic Cores for CNN Operations.
Proceedings of the IEEE European Test Symposium, 2024
2023
Analyzing the Reliability of TCUs Through Micro-architecture and Structural Evaluations for Two Real Number Formats.
Proceedings of the VLSI-SoC 2023: Innovations for Trustworthy Artificial Intelligence, 2023
Analyzing the Impact of Different Real Number Formats on the Structural Reliability of TCUs in GPUs.
Proceedings of the 31st IFIP/IEEE International Conference on Very Large Scale Integration, 2023
Proceedings of the 24th IEEE Latin American Test Symposium, 2023
Proceedings of the IEEE European Test Symposium, 2023
Proceedings of the 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, 2023
2022
Proceedings of the IEEE International Test Conference in Asia, 2022
Reliability Assessment of Neural Networks in GPUs: A Framework For Permanent Faults Injections.
Proceedings of the 31st IEEE International Symposium on Industrial Electronics, 2022
Effective fault simulation of GPU's permanent faults for reliability estimation of CNNs.
Proceedings of the 28th IEEE International Symposium on On-Line Testing and Robust System Design, 2022