Oriol Avino-Salvado

According to our database, Oriol Avino-Salvado authored at least 8 papers between 2014 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2024

Physics-Based Strategies for Fast TDDB Testing and Lifetime Estimation in SiC Power MOSFETs.

Oriol Avino-Salvado, Cyril Buttay, Ferran Bonet, Christophe Raynaud, Pascal Bevilacqua, José Rebollo, Hervé Morel, Xavier Perpiñà

IEEE Trans. Ind. Electron., May, 2024

2023

Die-Level Transient Thermal Imaging Based on Fourier Series Reconstruction for Power Industrial Electronics.

Conrad Ferrer, Oriol Avino-Salvado, Miquel Vellvehí, Xavier Jordà, Xavier Perpiñà

IEEE Trans. Instrum. Meas., 2023

2021

Local Thermal Resistance Extraction in Monolithic Microwave Integrated Circuits.

Miquel Vellvehí, Xavier Perpiñà, Javier Leon, Oriol Avino-Salvado, Conrad Ferrer, Xavier Jordà

IEEE Trans. Ind. Electron., 2021

2019

VTH-Hysteresis and Interface States Characterisation in SiC Power MOSFETs with Planar and Trench Gate.

Besar Asllani, Alberto Castellazzi, Oriol Avino-Salvado, Asad Fayyaz, Hervé Morel, Dominique Planson

Proceedings of the IEEE International Reliability Physics Symposium, 2019

2018

Threshold voltage instability in SiC MOSFETs as a consequence of current conduction in their body diode.

Oriol Avino-Salvado, Hervé Morel, Cyril Buttay, Denis Labrousse, Stéphane Lefebvre

Microelectron. Reliab., 2018

2017

High temperature ageing of microelectronics assemblies with SAC solder joints.

Wissam Sabbah, Pierre Bondue, Oriol Avino-Salvado, Cyril Buttay, Hélène Frémont, Alexandrine Guédon-Gracia, Hervé Morel

Microelectron. Reliab., 2017

Lifetime of power electronics interconnections in accelerated test conditions: High temperature storage and thermal cycling.

Wissam Sabbah, Faical Arabi, Oriol Avino-Salvado, Cyril Buttay, L. Théolier, Hervé Morel

Microelectron. Reliab., 2017

2014

Simplified Mathematical Model for Calculating the Oxygen Excess Ratio of a PEM Fuel Cell System in Real-Time Applications.

Carlos Restrepo, Tine Konjedic, Cristian Guarnizo, Oriol Avino-Salvado, Javier Calvente, Alfonso Romero, Roberto Giral

IEEE Trans. Ind. Electron., 2014