Theresia Knobloch

According to our database, Theresia Knobloch authored at least 7 papers between 2017 and 2024.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2024

Quantifying Defect-Mediated Electron Capture and Emission in Flexible Monolayer WS2 Field-Effect Transistors.

J. A. Yang, Eros Reato, Theresia Knobloch, J.-S. Ko, Z. Zhang, Andrew J. Mannix, Krishna Saraswat, Tibor Grasser, Max Christian Lemme, Eric Pop

Proceedings of the Device Research Conference, 2024

2022

Finding Suitable Gate Insulators for Reliable 2D FETs.

Theresia Knobloch, Yury Yu. Illarionov, Tibor Grasser

Proceedings of the IEEE International Reliability Physics Symposium, 2022

Silicon-Impurity Defects in Calcium Fluoride: A First Principles Study.

Dominic Waldhoer, Bibhas Manna, Al-Moatasem Bellah El-Sayed, Theresia Knobloch, Yury Illarionov, Tibor Grasser

Proceedings of the 52nd IEEE European Solid-State Device Research Conference, 2022

2020

Crystalline Calcium Fluoride: A Record-Thin Insulator for Nanoscale 2D Electronics.

Yury Yu. Illarionov, Alexander G. Banshchikov, Theresia Knobloch, Dmitry K. Polyushkin, Stefan Wachter, V. V. Fedorov, S. M. Suturin, M. Stöger-Pollach, Thomas Mueller, M. I. Vexler, Nikolai S. Sokolov, Tibor Grasser

Proceedings of the 2020 Device Research Conference, 2020

2018

Comphy - A compact-physics framework for unified modeling of BTI.

Gerhard Rzepa, Jacopo Franco, Barry J. O'Sullivan, A. Subirats, Marko Simicic, Geert Hellings, Pieter Weckx, Markus Jech, Theresia Knobloch, Michael Waltl, Philippe Roussel, Dimitri Linten, Ben Kaczer, Tibor Grasser

Microelectron. Reliab., 2018

Reliability of next-generation field-effect transistors with transition metal dichalcogenides.

Yury Yu. Illarionov, Aday J. Molina-Mendoza, Michael Waltl, Theresia Knobloch, Marco M. Furchi, Thomas Mueller, Tibor Grasser

Proceedings of the IEEE International Reliability Physics Symposium, 2018

2017

Physical modeling of the hysteresis in M0S2 transistors.

Theresia Knobloch, Gerhard Rzepa, Yury Yu. Illarionov, Michael Waltl, Franz Schanovsky, Markus Jech, Bernhard Stampfer, Marco M. Furchi, Thomas Muller, Tibor Grasser

Proceedings of the 47th European Solid-State Device Research Conference, 2017