Yingchun Lu
Orcid: 0000-0002-2621-0933
According to our database1,
Yingchun Lu
authored at least 30 papers
between 2017 and 2023.
Collaborative distances:
Collaborative distances:
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Bibliography
2023
ACM Trans. Reconfigurable Technol. Syst., December, 2023
Low-overhead TRNG based on MUX for cryptographic protection using multiphase sampling.
J. Supercomput., October, 2023
Electrical activity and synchronization of memristor synapse-coupled HR network based on energy method.
Neurocomputing, August, 2023
Integr., May, 2023
A dynamically reconfigurable entropy source circuit for high-throughput true random number generator.
Microelectron. J., March, 2023
Improvement of cell internal weak defects detection under process variation by optimizing test path and test pattern.
Microelectron. J., 2023
Microelectron. J., 2023
2022
Microprocess. Microsystems, April, 2022
DCBuf: a high-performance wireless network-on-chip architecture with distributed wireless interconnects and centralized buffer sharing.
Wirel. Networks, 2022
Design of True Random Number Generator Based on Multi-Stage Feedback Ring Oscillator.
IEEE Trans. Circuits Syst. II Express Briefs, 2022
A reconfigurable PUF structure with dual working modes based on entropy separation model.
Microelectron. J., 2022
Microelectron. J., 2022
J. Circuits Syst. Comput., 2022
Integr., 2022
J. Electron. Test., 2022
Proceedings of the Asian Hardware Oriented Security and Trust Symposium, 2022
2021
Pure Digital Scalable Mixed Entropy Separation Structure for Physical Unclonable Function and True Random Number Generator.
IEEE Trans. Very Large Scale Integr. Syst., 2021
High-Throughput Portable True Random Number Generator Based on Jitter-Latch Structure.
IEEE Trans. Circuits Syst. I Regul. Pap., 2021
A high reliability physically unclonable function based on multiple tunable ring oscillator.
Microelectron. J., 2021
Microelectron. J., 2021
Microelectron. J., 2021
Cross-Layer Dual Modular Redundancy Hardened Scheme of Flip-Flop Design Based on Sense-Amplifier.
J. Circuits Syst. Comput., 2021
Integr., 2021
J. Electron. Test., 2021
2020
IEEE Access, 2020
2018
An All-Digital and Jitter-Quantizing True Random Number Generator in SRAM-Based FPGAs.
Proceedings of the 27th IEEE Asian Test Symposium, 2018
2017
IEICE Electron. Express, 2017