Emmanuel Chery

According to our database, Emmanuel Chery authored at least 6 papers between 2013 and 2025.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2025

Leakage and TDDB Mechanisms in 18 nm Pitch Direct Metal Etch Ru Interconnects with Airgaps.

Alicja Lesniewska, Y. Fang, G. Delie, Philippe Roussel, Koen Van Sever, Emmanuel Chery, O. Varela Pedreira, Ivan Ciofi, S. H. Park, Zsolt Tokei, Kris Croes

Proceedings of the IEEE International Reliability Physics Symposium, 2025

Impact of Al-doping on Al: HfO2Dielectric Reliability in MIM Capacitors.

C. Fohn, F. Zharfan, Emmanuel Chery, Kris Croes, Michele Stucchi, V. Afanas'ev

Proceedings of the IEEE International Reliability Physics Symposium, 2025

Reliability Study of La- and Al-Doped ZrO2 Dielectrics for High Density MIMCAP Applications.

Emmanuel Chery, Lucie Sourgen, Jacopo Franco, Mihaela Ioana Popovici, Eric Beyne

Proceedings of the IEEE International Reliability Physics Symposium, 2025

2022

Assessment of critical Co electromigration parameters.

O. Varela Pedreira, Melina Lofrano, Houman Zahedmanesh, Philippe J. Roussel, Marleen H. van der Veen, Veerle Simons, Emmanuel Chery, Ivan Ciofi, Kris Croes

Proceedings of the IEEE International Reliability Physics Symposium, 2022

Reliability Investigation of W2W Hybrid Bonding Interface: Breakdown Voltage and Leakage Mechanism.

Lin Hou, Emmanuel Chery, Kristof Croes, Davide Tierno, Soon Aik Chew, Yangyin Chen, Peter Rakbin, Eric Beyne

Proceedings of the IEEE International Reliability Physics Symposium, 2022

2013

Reliability of TSV interconnects: Electromigration, thermal cycling, and impact on above metal level dielectric.

Thomas Frank, Stéphane Moreau, Cédrick Chappaz, Patrick Leduc, Lucile Arnaud, Aurélie Thuaire, Emmanuel Chery, F. Lorut, Lorena Anghel, Gilles Poupon

Microelectron. Reliab., 2013