Frédéric Saigné
  According to our database1,
  Frédéric Saigné
  authored at least 18 papers
  between 2005 and 2020.
  
  
Collaborative distances:
Collaborative distances:
Timeline
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Bibliography
  2020
Development and evaluation of a flexible instrumentation layer for system-level testing of radiation effects.
    
  
    Proceedings of the IEEE Latin-American Test Symposium, 2020
    
  
Evaluation and Analysis of Technologies for Robotic Platforms for the Nuclear Decommissioning.
    
  
    Proceedings of the 15th Design & Technology of Integrated Systems in Nanoscale Era, 2020
    
  
    Proceedings of the 15th Design & Technology of Integrated Systems in Nanoscale Era, 2020
    
  
  2018
Analysis of the charge sharing effect in the SET sensitivity of bulk 45 nm standard cell layouts under heavy ions.
    
  
    Microelectron. Reliab., 2018
    
  
  2017
    Microelectron. Reliab., 2017
    
  
Structural pattern extraction from asynchronous two-photon laser fault injection using spectral analysis.
    
  
    Microelectron. Reliab., 2017
    
  
  2015
    Proceedings of the 6th International Workshop on Advances in Sensors and Interfaces, 2015
    
  
  2013
Modeling dose effects in electronics devices: Dose and temperature dependence of power MOSFET.
    
  
    Microelectron. Reliab., 2013
    
  
Transient device simulation of neutron-induced failure in IGBT: A first step for developing a compact predictive model.
    
  
    Microelectron. Reliab., 2013
    
  
Characterization of an SRAM based particle detector for mixed-field radiation environments.
    
  
    Proceedings of the 5th IEEE International Workshop on Advances in Sensors and Interfaces, 2013
    
  
SRAM soft error rate evaluation under atmospheric neutron radiation and PVT variations.
    
  
    Proceedings of the 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), 2013
    
  
On the correlation between Static Noise Margin and Soft Error Rate evaluated for a 40nm SRAM cell.
    
  
    Proceedings of the 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2013
    
  
  2012
On the reliability assessment of trench fieldstop IGBT under atmospheric neutron spectrum.
    
  
    Microelectron. Reliab., 2012
    
  
    Proceedings of the 18th IEEE International On-Line Testing Symposium, 2012
    
  
  2011
    Microelectron. Reliab., 2011
    
  
Neutron detection in atmospheric environment through static and dynamic SRAM-based test bench.
    
  
    Proceedings of the 12th Latin American Test Workshop, 2011
    
  
  2005
    Proceedings of the 11th IEEE International On-Line Testing Symposium (IOLTS 2005), 2005