Valery A. Vardanian
According to our database1,
Valery A. Vardanian
authored at least 33 papers
between 1985 and 2019.
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Bibliography
2019
Proceedings of the 2019 IEEE East-West Design & Test Symposium, 2019
2015
Proceedings of the 2015 IEEE East-West Design & Test Symposium, 2015
2014
Proceedings of the 32nd IEEE VLSI Test Symposium, 2014
Proceedings of the 2014 East-West Design & Test Symposium, 2014
2013
An effective solution for building memory BIST infrastructure based on fault periodicity.
Proceedings of the 31st IEEE VLSI Test Symposium, 2013
An efficient fault diagnosis and localization algorithm for Successive-Approximation Analog to Digital Converters.
Proceedings of the East-West Design & Test Symposium, 2013
Proceedings of the East-West Design & Test Symposium, 2013
Proceedings of the East-West Design & Test Symposium, 2013
2012
A New Method for March Test Algorithm Generation and Its Application for Fault Detection in RAMs.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2012
2011
J. Electron. Test., 2011
Proceedings of the 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 2011
Proceedings of the 20th IEEE Asian Test Symposium, 2011
2010
An efficient March test for detection of all two-operation dynamic faults from subclass Sav.
Proceedings of the 2010 East-West Design & Test Symposium, 2010
2008
An Efficient March-Based Three-Phase Fault Location and Full Diagnosis Algorithm for Realistic Two-Operation Dynamic Faults in Random Access Memories.
Proceedings of the 26th IEEE VLSI Test Symposium (VTS 2008), April 27, 2008
2007
J. Electron. Test., 2007
A March-based Fault Location Algorithm with Partial and Full Diagnosis for All Simple Static Faults in Random Access Memories.
Proceedings of the 10th IEEE Workshop on Design & Diagnostics of Electronic Circuits & Systems (DDECS 2007), 2007
2006
Minimal March Test Algorithm for Detection of Linked Static Faults in Random Access Memories.
Proceedings of the 24th IEEE VLSI Test Symposium (VTS 2006), 30 April, 2006
A March-Based Algorithm for Location and Full Diagnosis of All Unlinked Static Faults.
Proceedings of the 14th IEEE International Workshop on Memory Technology, 2006
Proceedings of the 11th European Test Symposium, 2006
Minimal March-Based Fault Location Algorithm with Partial Diagnosis for all Static Faults in Random Access Memories.
Proceedings of the 9th IEEE Workshop on Design & Diagnostics of Electronic Circuits & Systems (DDECS 2006), 2006
2005
Proceedings of the 23rd IEEE VLSI Test Symposium (VTS 2005), 2005
Proceedings of the 11th IEEE International On-Line Testing Symposium (IOLTS 2005), 2005
2004
IEEE Des. Test Comput., 2004
Proceedings of the 22nd IEEE VLSI Test Symposium (VTS 2004), 2004
Proceedings of the 12th IEEE International Workshop on Memory Technology, 2004
2002
Proceedings of the 10th IEEE International Workshop on Memory Technology, 2002
2001
Proceedings of the 9th IEEE International Workshop on Memory Technology, 2001
2000
Improving the Error Detection Ability of Concurrent Checkers by Observation Point Insertion in the Circuit Under Check.
Proceedings of the 2000 Design, 2000
1997
Proceedings of the 15th IEEE VLSI Test Symposium (VTS'97), 1997
1996
Proceedings of the 14th IEEE VLSI Test Symposium (VTS'96), April 28, 1996
1994
On the complexity of terminal stuck-at fault detection tests for monotone Boolean functions.
Proceedings of the 12th IEEE VLSI Test Symposium (VTS'94), 1994
1985
Proceedings of the Fundamentals of Computation Theory, 1985