Romain Wacquez

According to our database1, Romain Wacquez authored at least 13 papers between 2011 and 2025.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Dataset
Other 

Links

On csauthors.net:

Bibliography

2025
On the Impact of Metastability in Jitter Based TRNG.
Proceedings of the IEEE International Symposium on Hardware Oriented Security and Trust, 2025

2024
Impact of the Flicker Noise on the Ring Oscillator-based TRNGs.
IACR Trans. Cryptogr. Hardw. Embed. Syst., 2024

OpenTRNG: an open-source initiative for ring-oscillator based TRNGs.
Proceedings of the IEEE International Conference on Design, 2024

2019
Light-Weight Cipher Based on Hybrid CMOS/STT-MRAM: Power/Area Analysis.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2019

Dual Detection of Heating and Photocurrent attacks (DDHP) Sensor using Hybrid CMOS/STT-MRAM.
Proceedings of the 25th IEEE International Symposium on On-Line Testing and Robust System Design, 2019

2018
Impact of a Laser Pulse on a STT-MRAM Bitcell: Security and Reliability Issues.
Proceedings of the 24th IEEE International Symposium on On-Line Testing And Robust System Design, 2018

MRAM: from STT to SOT, for security and memory.
Proceedings of the Conference on Design of Circuits and Integrated Systems, 2018

2017
Thermal laser attack and high temperature heating on HfO2-based OxRAM cells.
Proceedings of the 23rd IEEE International Symposium on On-Line Testing and Robust System Design, 2017

2013
The Coupled Atom Transistor: A first realization with shallow donors implanted in a FDSOI silicon nanowire.
Proceedings of the European Solid-State Device Research Conference, 2013

2012
Variability in Fully Depleted MOSFETs.
Proceedings of the IEEE International Conference on IC Design & Technology, 2012

Scaling of Trigate nanowire (NW) MOSFETs Down to 5 nm Width: 300 K transition to Single Electron Transistor, challenges and opportunities.
Proceedings of the 2012 European Solid-State Device Research Conference, 2012


2011
Mass Production of Silicon MOS-SETs: Can We Live with Nano-Devices' Variability?
Proceedings of the 2nd European Future Technologies Conference and Exhibition, 2011


  Loading...