Romain Wacquez

According to our database, Romain Wacquez authored at least 17 papers between 2011 and 2026.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2026

Back-Gate Voltage Scaling for Error Generation in LPPN on 22-nm FD-SOI Technology.

Andrea Marenco, Mathieu Leconte, Emanuele Valea, Romain Wacquez

IEEE Trans. Very Large Scale Integr. Syst., April, 2026

2025

On the Impact of Metastability in Jitter Based TRNG.

Florian Pebay-Peyroula, Licinius-Pompiliu Benea, Mikael Carmona, Romain Wacquez

Proceedings of the IEEE International Symposium on Hardware Oriented Security and Trust, 2025

2024

COSOI: True Random Number Generator Based on Coherent Sampling using the FD-SOI technology.

Licinius Benea, Florian Pebay-Peyroula, Mikael Carmona, Romain Wacquez

WiPiEC Journal, 2024

Impact of the Flicker Noise on the Ring Oscillator-based TRNGs.

Licinius Benea, Mikael Carmona, Viktor Fischer, Florian Pebay-Peyroula, Romain Wacquez

IACR Trans. Cryptogr. Hardw. Embed. Syst., 2024

OpenTRNG: an open-source initiative for ring-oscillator based TRNGs.

Florian Pebay-Peyroula, Licinius-Pompiliu Benea, Mikael Carmona, Romain Wacquez

Proceedings of the IEEE International Conference on Design, 2024

2022

On the Characterization of Jitter in Ring Oscillators using Allan variance for True Random Number Generator Applications.

Licinius Benea, Mikael Carmona, Florian Pebay-Peyroula, Romain Wacquez

Proceedings of the 25th Euromicro Conference on Digital System Design, 2022

2021

A Near-Instantaneous and Non-Invasive Erasure Design Technique to Protect Sensitive Data Stored in Secure SRAMs.

Jean-Philippe Noel, Manuel Pezzin, Jean-Frédéric Christmann, Lorenzo Ciampolini, M. Le Coadou, M. Diallo, Florent Lepin, B. Blampey, Simone Bacles-Min, Romain Wacquez, Bastien Giraud

Proceedings of the 47th ESSCIRC 2021, 2021

2019

Light-Weight Cipher Based on Hybrid CMOS/STT-MRAM: Power/Area Analysis.

Mounia Kharbouche-Harrari, Gregory di Pendina, Romain Wacquez, Bernard Dieny, Driss Aboulkassimi, Jérémy Postel-Pellerin, Jean-Michel Portal

Proceedings of the IEEE International Symposium on Circuits and Systems, 2019

Dual Detection of Heating and Photocurrent attacks (DDHP) Sensor using Hybrid CMOS/STT-MRAM.

Mounia Kharbouche-Harrari, Romain Wacquez, Gregory di Pendina, Jean-Max Dutertre, Jérémy Postel-Pellerin, Driss Aboulkassimi, Jean-Michel Portal

Proceedings of the 25th IEEE International Symposium on On-Line Testing and Robust System Design, 2019

2018

Impact of a Laser Pulse on a STT-MRAM Bitcell: Security and Reliability Issues.

Mounia Kharbouche-Harrari, Jérémy Postel-Pellerin, Gregory di Pendina, Romain Wacquez, Driss Aboulkassimi, Marc Bocquet, R. Sousa, R. Delattre, Jean-Michel Portal

Proceedings of the 24th IEEE International Symposium on On-Line Testing And Robust System Design, 2018

MRAM: from STT to SOT, for security and memory.

Mounia Kharbouche-Harrari, Rana Alhalabi, Jérémy Postel-Pellerin, Romain Wacquez, Driss Aboulkassimi, Etienne Nowak, Ioan Lucian Prejbeanu, Guillaume Prenat, Gregory di Pendina

Proceedings of the Conference on Design of Circuits and Integrated Systems, 2018

2017

Thermal laser attack and high temperature heating on HfO2-based OxRAM cells.

Alexis Krakovinsky, Marc Bocquet, Romain Wacquez, Jean Coignus, Jean-Michel Portal

Proceedings of the 23rd IEEE International Symposium on On-Line Testing and Robust System Design, 2017

2013

The Coupled Atom Transistor: A first realization with shallow donors implanted in a FDSOI silicon nanowire.

Benoit Voisin, Benoit Roche, Eva Dupont-Ferrier, Benoit Sklénard, Manuel Cobian, Xavier Jehl, Olga Cueto, Romain Wacquez, Maud Vinet, Yann-Michel Niquet, Silvano De Franceschi, Marc Sanquer

Proceedings of the European Solid-State Device Research Conference, 2013

2012

Variability in Fully Depleted MOSFETs.

Maud Vinet, T. Hook, Yannick Le Tiec, R. Murphy, Shom Ponoth, Laurent Grenouillet, Romain Wacquez

Proceedings of the IEEE International Conference on IC Design & Technology, 2012

Scaling of Trigate nanowire (NW) MOSFETs Down to 5 nm Width: 300 K transition to Single Electron Transistor, challenges and opportunities.

Veeresh Deshpande, Sylvain Barraud, Xavier Jehl, Romain Wacquez, Maud Vinet, Remi Coquand, B. Roche, B. Voisin, François Triozon, C. Vizioz, L. Tosti, Bernard Previtali, P. Perreau, T. Poiroux, Marc Sanquer, Olivier Faynot

Proceedings of the 2012 European Solid-State Device Research Conference, 2012

Extremely thin SOI for system-on-chip applications.

Ali Khaki-Firooz, Kangguo Cheng, Qing Liu, Toshiharu Nagumo, Nicolas Loubet, Alexander Reznicek, James Kuss, J. Gimbert, Raghavasimhan Sreenivasan, Maud Vinet, Laurent Grenouillet, Yannick Le Tiec, Romain Wacquez, Z. Ren, J. Cai, Davood Shahrjerdi, Prasanna Kulkarni, Shom Ponoth, Scott Luning, Bruce Doris

Proceedings of the IEEE 2012 Custom Integrated Circuits Conference, 2012

2011

Mass Production of Silicon MOS-SETs: Can We Live with Nano-Devices' Variability?

Xavier Jehl, B. Roche, Marc Sanquer, B. Voisin, Romain Wacquez, Veeresh Deshpande, Bernard Previtali, Maud Vinet, J. Verduijn, Giuseppe Carlo Tettamanzi, Sven Rogge, D. Kotekar-Patil, Matthias Ruoff, D. Kern, D. A. Wharam, M. Belli, Enrico Prati, Marco Fanciulli

Proceedings of the 2nd European Future Technologies Conference and Exhibition, 2011