Shiro Kamohara

According to our database1, Shiro Kamohara authored at least 13 papers between 1999 and 2017.

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Bibliography

2017
SOTB (Silicon on Thin Buried Oxide): More than Moore technology for IoT and Automotive.
Proceedings of the 2017 IEEE International Conference on IC Design and Technology, 2017

2015
A Silicon-on-Thin-Buried-Oxide CMOS Microcontroller with Embedded Atom-Switch ROM.
IEEE Micro, 2015

A Perpetuum Mobile 32bit CPU on 65nm SOTB CMOS Technology with Reverse-Body-Bias Assisted Sleep Mode.
IEICE Trans. Electron., 2015

Design of a low-power fixed-point 16-bit digital signal processor using 65nm SOTB process.
Proceedings of the 2015 International Conference on IC Design & Technology, 2015

0.39-V, 18.26-µW/MHz SOTB CMOS Microcontroller with embedded atom switch ROM.
Proceedings of the 2015 IEEE Symposium in Low-Power and High-Speed Chips, 2015

2014
A Perpetuum Mobile 32bit CPU with 13.4pJ/cycle, 0.14µA sleep current using Reverse Body Bias Assisted 65nm SOTB CMOS technology.
Proceedings of the 2014 IEEE Symposium on Low-Power and High-Speed Chips, 2014

2011
A New Critical Area Simulation Algorithm and Its Application for Failing Bit Analysis.
IEICE Trans. Electron., 2011

2007
Random Telegraph Signal in Flash Memory: Its Impact on Scaling of Multilevel Flash Memory Beyond the 90-nm Node.
IEEE J. Solid State Circuits, 2007

2005
A low-power four-transistor SRAM cell with a stacked vertical poly-silicon PMOS and a dual-word-voltage scheme.
IEEE J. Solid State Circuits, 2005

2004
Analysis of SRAM neutron-induced errors based on the consideration of both charge-collection and parasitic-bipolar failure modes.
Proceedings of the IEEE 2004 Custom Integrated Circuits Conference, 2004

2002
Repair Yield Simulation with Iterative Critical Area Analysis for Different Types of Failure.
Proceedings of the 17th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2002), 2002

2000
Circuit performance oriented device optimization using BSIM3 pre-silicon model parameters.
Proceedings of ASP-DAC 2000, 2000

1999
Pre-silicon parameter generation methodology using BSIM3 for device/circuit concurrent design.
Proceedings of the IEEE 1999 Custom Integrated Circuits Conference, 1999


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