Weidong Zhang

According to our database, Weidong Zhang authored at least 16 papers between 2014 and 2021.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2021

General type-2 fuzzy multi-switching synchronization of fractional-order chaotic systems.

Mohammad Hosein Sabzalian, Ardashir Mohammadzadeh, Weidong Zhang, Kittisak Jermsittiparsert

Eng. Appl. Artif. Intell., 2021

On the Accuracy in Modeling the Statistical Distribution of Random Telegraph Noise Amplitude.

Mehzabeen Mehedi, Kean Hong Tok, Zengliang Ye, Jianfu Zhang, Zhigang Ji, Weidong Zhang, John S. Marsland

IEEE Access, 2021

An integrated method for extracting the statistical distribution of RTN time constants.

Mehzabeen Mehedi, Kean Hong Tok, Jian Fu Zhang, Zhigang Ji, Zengliang Ye, Weidong Zhang, John S. Marsland

Proceedings of the 14th IEEE International Conference on ASIC, 2021

True random number generator based on switching probability of volatile GeXSe1-X ovonic threshold switching selectors.

Z. Chai, P. Freitas, Weidong Zhang, Jian Fu Zhang, John S. Marsland

Proceedings of the 14th IEEE International Conference on ASIC, 2021

2020

A robust control of a class of induction motors using rough type-2 fuzzy neural networks.

Mohammad Hosein Sabzalian, Ardashir Mohammadzadeh, Shuyi Lin, Weidong Zhang

Soft Comput., 2020

An Assessment of the Statistical Distribution of Random Telegraph Noise Time Constants.

Mehzabeen Mehedi, Kean Hong Tok, Jianfu Zhang, Zhigang Ji, Zengliang Ye, Weidong Zhang, John S. Marsland

IEEE Access, 2020

2019

Voltage step stress: a technique for reducing test time of device ageing.

Jian Fu Zhang, Zhigang Ji, Meng Duan, Wei Dong Zhang, Cezhou Zhao

Proceedings of the International Conference on IC Design and Technology, 2019

An assessment of RTN-induced threshold voltage jitter.

Jianfu Zhang, Azrif Manut, Rui Gao, Mehzabeen Mehedi, Zhigang Ji, Weidong Zhang, John S. Marsland

Proceedings of the 13th IEEE International Conference on ASIC, 2019

2018

As-grown-generation (AG) model of NBTI: A shift from fitting test data to prediction.

Jianfu Zhang, Zhigang Ji, Wei Dong Zhang

Microelectron. Reliab., 2018

Strain-Reduction Induced Rise in Channel Temperature at Ohmic Contacts of GaN HEMTs.

Steven J. Duffy, Brahim Benbakhti, Karol Kalna, Mohammed Boucherta, Wei Dong Zhang, Nour E. Bourzgui, Ali Soltani

IEEE Access, 2018

2017

Role of Self-Heating and Polarization in AlGaN/GaN-Based Heterostructures.

Khaled Ahmeda, Brendan Ubochi, Brahim Benbakhti, Steven J. Duffy, Ali Soltani, Wei Dong Zhang, Karol Kalna

IEEE Access, 2017

Hot carrier aging of nano-scale devices: Characterization method, statistical variation, and their impact on use voltage.

Jianfu Zhang, Meng Duan, Zhigang Ji, Weidong Zhang

Proceedings of the 12th IEEE International Conference on ASIC, 2017

2015

ESD characterization of planar InGaAs devices.

Zhigang Ji, Dimitri Linten, Roman Boschke, Geert Hellings, S. H. Chen, AliReza Alian, D. Zhou, Y. Mols, Tsvetan Ivanov, Jacopo Franco, Ben Kaczer, X. Zhang, R. Gao, Jianfu Zhang, Weidong Zhang, Nadine Collaert, Guido Groeseneken

Proceedings of the IEEE International Reliability Physics Symposium, 2015

NBTI prediction and its induced time dependent variation.

Jianfu Zhang, Meng Duan, Zhigang Ji, Weidong Zhang

Proceedings of the 2015 IEEE 11th International Conference on ASIC, 2015

2014

Optimization of inter-gate-dielectrics in hybrid float gate devices to reduce window instability during memory operations.

Baojun Tang, Weidong Zhang, Laurent Breuil, Colin Robinson, Yunqi Wang, Maria Toledano-Luque, Geert Van den Bosch, Jianfu Zhang, Jan Van Houdt

Microelectron. Reliab., 2014

Energy distribution of positive charges in high-k dielectric.

Sharifah Wan Muhamad Hatta, Zhigang Ji, Jianfu Zhang, Weidong Zhang, Norhayati Soin, Ben Kaczer, Stefan De Gendt, Guido Groeseneken

Microelectron. Reliab., 2014