Adrian Chasin

According to our database, Adrian Chasin authored at least 4 papers between 2023 and 2025.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2025

Advanced RTN Analysis on 3D NAND Trench Devices Using Physics-Informed Machine Learning Framework.

Yusuke Higashi, Anirudh Varanasi, Philippe J. Roussel, Pablo Saraza-Canflanca, J. P. Bastos, Alexander Grill, E. Catapano, R. Asanovski, Jacopo Franco, Ben Kaczer, Adrian Chasin, Devin Verreck, S. Ramesh, Laurent Breuil, Antonio Arreghini, S. Rachidi, Y. Jeong, Geert Van den Bosch, Maarten Rosmeulen, Robin Degraeve

Proceedings of the IEEE International Reliability Physics Symposium, 2025

Gate Stack Development for Next Gen High Voltage Periphery DRAM Devices.

J. P. Bastos, Jacopo Franco, Barry J. O'Sullivan, Yusuke Higashi, Adrian Chasin, J. Ganguly, Hiroaki Arimura, Alessio Spessot, M.-S. Kim, N. Horiguchi

Proceedings of the IEEE International Reliability Physics Symposium, 2025

2023

Investigating Nanowire, Nanosheet and Forksheet FET Hot-Carrier Reliability via TCAD Simulations: Invited Paper.

Michiel Vandemaele, Ben Kaczer, Erik Bury, Jacopo Franco, Adrian Chasin, Alexander Makarov, Hans Mertens, Geert Hellings, Guido Groeseneken

Proceedings of the IEEE International Reliability Physics Symposium, 2023

Reliability challenges in Forksheet Devices: (Invited Paper).

Erik Bury, Michiel Vandemaele, Jacopo Franco, Adrian Chasin, Stanislav Tyaginov, A. Vandooren, Romain Ritzenthaler, Hans Mertens, Javier Diaz-Fortuny, N. Horiguchi, Dimitri Linten, Ben Kaczer

Proceedings of the IEEE International Reliability Physics Symposium, 2023