Chunyu Peng
Orcid: 0000-0003-2408-5048Affiliations:
- Anhui University, Hefei, China
According to our database1,
Chunyu Peng
authored at least 81 papers
between 2015 and 2025.
Collaborative distances:
Collaborative distances:
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Bibliography
2025
A 28 nm Dual-Mode SRAM-CIM Macro With Local Computing Cell for CNNs and Grayscale Edge Detection.
IEEE Trans. Very Large Scale Integr. Syst., August, 2025
Full-Array Boolean Logic CIM Macro With Self-Recycling 10T-SRAM Cell for AES Systems.
IEEE Trans. Very Large Scale Integr. Syst., August, 2025
A 28-nm Cascode Current Mirror-Based Inconsistency-Free Charging-and-Discharging SRAM-CIM Macro for High-Efficient Convolutional Neural Networks.
IEEE Trans. Very Large Scale Integr. Syst., July, 2025
A 28-nm 9T1C SRAM-Based CIM Macro With Hierarchical Capacitance Weighting and Two-Step Capacitive Comparison ADCs for CNNs.
IEEE Trans. Very Large Scale Integr. Syst., July, 2025
Circuits Syst. Signal Process., July, 2025
A High-Performance and High-Robustness Triple-Node-Upset Tolerant Latch Based on Redundant-Node Hardening.
IEEE Trans. Very Large Scale Integr. Syst., May, 2025
High-Reliability and High-Throughput CIM 10T-SRAM for Multiplication and Accumulation Operations With 274.3 GOPS and 200-237.5 TOPS/W.
IEEE Trans. Very Large Scale Integr. Syst., April, 2025
A Low-Cost and Triple-Node-Upset Self-Recoverable Latch Design With Low Soft Error Rate.
IEEE Trans. Very Large Scale Integr. Syst., April, 2025
High-throughput in-memory bitwise computing based on a coupled dual-SRAM array with independent operands.
Int. J. Circuit Theory Appl., April, 2025
Real-time bit-line leakage balance circuit with four-input low-offset SA considering threshold voltage for SRAM stability design.
Int. J. Circuit Theory Appl., April, 2025
Microelectron. J., 2025
A low-power, area-efficient digital decimation filter with column-shared counter topology for CMOS image sensor.
Microelectron. J., 2025
A residual pulse broadening interpolation quantization column-level ADC architecture for CMOS image sensors.
Microelectron. J., 2025
An interval-adaptive correlated multiple sampling ADC with prejudgment logic for low-noise CMOS image sensors.
Microelectron. J., 2025
Hybrid MOSFET-TFET 11T SRAM cell with high write speed and free half-selected disturbance.
Microelectron. J., 2025
A high charge-discharge stability SRAM 10T1C XOR CIM macro applied in BCAM and Hamming distance.
Microelectron. J., 2025
Low-power 12T TFET-MOSFET hybrid SRAM bitcell and hybrid 8T SRAM array based on multiplexing strategy.
Microelectron. J., 2025
A PVT-insensitive 7T SRAM CIM macro for multibit multiplication with dynamic matching quantization circuits.
Microelectron. J., 2025
Proceedings of the IEEE International Symposium on Circuits and Systems, 2025
Proceedings of the IEEE International Symposium on Circuits and Systems, 2025
2024
High-Performance Latch Designs of Double-Node-Upset Self-Recovery and Triple-Node-Upset Tolerance for Aerospace Applications.
IEEE Trans. Aerosp. Electron. Syst., October, 2024
IEEE Trans. Circuits Syst. I Regul. Pap., September, 2024
IEEE Trans. Very Large Scale Integr. Syst., May, 2024
Soft-Error-Immune Quadruple-Node-Upset Tolerant Latch Based on Polarity Design and Source-Isolation Technologies.
IEEE Trans. Very Large Scale Integr. Syst., April, 2024
Flip Point Offset-Compensation Sense Amplifier With Sensing-Margin-Enhancement for Dynamic Random-Access Memory.
IEEE Trans. Circuits Syst. II Express Briefs, April, 2024
A 9T-SRAM in-memory computing macro for Boolean logic and multiply-and-accumulate operations.
Microelectron. J., February, 2024
A CFMB STT-MRAM-Based Computing-in-Memory Proposal With Cascade Computing Unit for Edge AI Devices.
IEEE Trans. Circuits Syst. I Regul. Pap., January, 2024
An 8b-Precison 16-Kb FDSOI 8T SRAM CIM macro based on time-domain for energy-efficient edge AI devices.
Microelectron. J., 2024
Microelectron. J., 2024
An 11-bit two-step column-shared ADC based on Flash/SS architecture for CMOS image sensor.
Microelectron. J., 2024
Microelectron. J., 2024
Microelectron. J., 2024
Microelectron. J., 2024
A 28-nm 9T SRAM-based CIM macro with capacitance weighting module and redundant array-assisted ADC.
Microelectron. J., 2024
Corrigendum to "A 9T-SRAM based computing-in-memory with redundant unit and digital operation for boolean logic and MAC" [145, March 2024, 106124.
Microelectron. J., 2024
A 9T-SRAM based computing-in-memory with redundant unit and digital operation for boolean logic and MAC.
Microelectron. J., 2024
Proceedings of the IEEE International Symposium on Circuits and Systems, 2024
Proceedings of the IEEE International Symposium on Circuits and Systems, 2024
2023
Novel radiation-hardened-by-design (RHBD) 14T memory cell for aerospace applications in 65 nm CMOS technology.
Microelectron. J., November, 2023
A Fully Digital SRAM-Based Four-Layer In-Memory Computing Unit Achieving Multiplication Operations and Results Store.
IEEE Trans. Very Large Scale Integr. Syst., June, 2023
IEEE J. Solid State Circuits, May, 2023
High Restore Yield NVSRAM Structures With Dual Complementary RRAM Devices for High-Speed Applications.
IEEE Trans. Very Large Scale Integr. Syst., April, 2023
IEEE Trans. Circuits Syst. II Express Briefs, March, 2023
Microelectron. J., February, 2023
Bit-line leakage current tracking and self-compensation circuit for SRAM reliability design.
Microelectron. J., February, 2023
Write-enhanced and radiation-hardened SRAM for multi-node upset tolerance in space-radiation environments.
Int. J. Circuit Theory Appl., January, 2023
IEICE Electron. Express, 2023
MS3DAAM: Multi-scale 3-D Analytic Attention Module for Convolutional Neural Networks.
Proceedings of the Neural Information Processing - 30th International Conference, 2023
First Foundry Platform Demonstration of Hybrid Tunnel FET and MOSFET Circuits Based on a Novel Laminated Well Isolation Technology.
Proceedings of the 53rd IEEE European Solid-State Device Research Conference, 2023
2022
IEEE Trans. Very Large Scale Integr. Syst., 2022
IEEE Trans. Circuits Syst. II Express Briefs, 2022
Offset-Compensation High-Performance Sense Amplifier for Low-Voltage DRAM Based on Current Mirror and Switching Point.
IEEE Trans. Circuits Syst. II Express Briefs, 2022
An offset cancellation technique for SRAM sense amplifier based on relation of the delay and offset.
Microelectron. J., 2022
IEICE Electron. Express, 2022
2021
IEEE Trans. Circuits Syst. II Express Briefs, 2021
Half-Select Disturb-Free 10T Tunnel FET SRAM Cell With Improved Noise Margin and Low Power Consumption.
IEEE Trans. Circuits Syst. II Express Briefs, 2021
Two-Direction In-Memory Computing Based on 10T SRAM With Horizontal and Vertical Decoupled Read Ports.
IEEE J. Solid State Circuits, 2021
Cascade Current Mirror to Improve Linearity and Consistency in SRAM In-Memory Computing.
IEEE J. Solid State Circuits, 2021
2020
IEEE Trans. Very Large Scale Integr. Syst., 2020
IEEE Trans. Very Large Scale Integr. Syst., 2020
Multiple Sharing 7T1R Nonvolatile SRAM With an Improved Read/Write Margin and Reliable Restore Yield.
IEEE Trans. Very Large Scale Integr. Syst., 2020
IEEE Trans. Circuits Syst., 2020
IEICE Electron. Express, 2020
2019
Radiation-Hardened 14T SRAM Bitcell With Speed and Power Optimized for Space Application.
IEEE Trans. Very Large Scale Integr. Syst., 2019
Physical mechanism study of N-well doping effects on the single-event transient characteristic of PMOS.
IEICE Electron. Express, 2019
An inverter chain with parallel output nodes for eliminating single-event transient pulse.
IEICE Electron. Express, 2019
IEICE Electron. Express, 2019
IEICE Electron. Express, 2019
2018
IEEE Trans. Very Large Scale Integr. Syst., 2018
Offset voltage suppressed sense amplifier with self-adaptive distribution transformation technique.
IEICE Electron. Express, 2018
A dual-output hardening design of inverter chain for P-hit single-event transient pulse elimination.
IEICE Electron. Express, 2018
2017
A Pipeline Replica Bitline Technique for Suppressing Timing Variation of SRAM Sense Amplifiers in a 28-nm CMOS Process.
IEEE J. Solid State Circuits, 2017
2016
IEICE Electron. Express, 2016
IEICE Electron. Express, 2016
IEICE Electron. Express, 2016
2015
Multi-stage dual replica bit-line delay technique for process-variation-robust timing of low voltage SRAM sense amplifier.
Frontiers Inf. Technol. Electron. Eng., 2015
Neurocomputing, 2015
Erratum: A novel cascade control replica-bitline delay technique for reducing timing process-variation of SRAM sense amplifier [IEICE Electronics Express Vol 12 (2015) No 5 pp 20150102].
IEICE Electron. Express, 2015
A novel cascade control replica-bitline delay technique for reducing timing process-variation of SRAM sense amplifier.
IEICE Electron. Express, 2015
Proceedings of the 12th International Conference on Fuzzy Systems and Knowledge Discovery, 2015