Costas Argyrides

According to our database, Costas Argyrides authored at least 34 papers between 2007 and 2023.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2023

Utilizing ECC Analytics to Improve Memory Lifecycle Management.

Costas Argyrides, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian

Proceedings of the IEEE International Test Conference, 2023

2022

Innovative Practices Track: What's Next for Automotive: Where and How to Improve Field Test and Enhance SoC Safety.

Minqiang Peng, Youfa Wu, Jialiang Li, Alex Yu, Grigor Tshagharyan, Costas Argyrides, Vilas Sridharan, Gurgen Harutyunyan, Yervant Zorian, Nilanjan Mukherjee

Proceedings of the 40th IEEE VLSI Test Symposium, 2022

A Novel Protection Technique for Embedded Memories with Optimized PPA.

Costas Argyrides, Vilas Sridharan, Hayk Danoyan, Gurgen Harutyunyan, Yervant Zorian

Proceedings of the IEEE International Test Conference, 2022

2019

Efficient Concurrent Error Detection for SEC-DAEC Encoders.

Jiaqiang Li, Pedro Reviriego, Costas Argyrides, Liyi Xiao

Proceedings of the 25th IEEE International Symposium on On-Line Testing and Robust System Design, 2019

2018

Extending 3-bit Burst Error-Correction Codes With Quadruple Adjacent Error Correction.

Jiaqiang Li, Pedro Reviriego, Liyi Xiao, Costas Argyrides, Jie Li

IEEE Trans. Very Large Scale Integr. Syst., 2018

Advanced ECC-Based FIT Rate Mitigation Technique for Automotive SoCs.

Hayk T. Grigoryan, Samvel K. Shoukourian, Gurgen Harutyunyan, Yervant Zorian, Costas Argyrides

Proceedings of the IEEE International Test Conference, 2018

2013

Using Single Error Correction Codes to Protect Against Isolated Defects and Soft Errors.

Costas Argyrides, Pedro Reviriego, Juan Antonio Maestro

IEEE Trans. Reliab., 2013

2012

Efficient error detection in Double Error Correction BCH codes for memory applications.

Pedro Reviriego, Costas Argyrides, Juan Antonio Maestro

Microelectron. Reliab., 2012

2011

Matrix Codes for Reliable and Cost Efficient Memory Chips.

Costas Argyrides, Dhiraj K. Pradhan, Taskin Koçak

IEEE Trans. Very Large Scale Integr. Syst., 2011

Reliability Analysis of H-Tree Random Access Memories Implemented With Built in Current Sensors and Parity Codes for Multiple Bit Upset Correction.

Costas Argyrides, Raul Chipana, Fabian Vargas, Dhiraj K. Pradhan

IEEE Trans. Reliab., 2011

Fault Tolerant Single Error Correction Encoders.

Juan Antonio Maestro, Pedro Reviriego, Costas Argyrides, Dhiraj K. Pradhan

J. Electron. Test., 2011

Decimal Hamming: A Software-Implemented Technique to Cope with Soft Errors.

Costas Argyrides, Ronaldo Rodrigues Ferreira, Carlos Arthur Lang Lisbôa, Luigi Carro

Proceedings of the 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2011

2010

Evaluation of a new low cost software level fault tolerance technique to cope with soft errors.

Jimmy Tarrillo, Carlos Arthur Lang Lisbôa, Luigi Carro, Costas Argyrides, Dhiraj K. Pradhan

Proceedings of the 11th Latin American Test Workshop, 2010

Improved Yield in Nanotechnology Circuits Using Non-square Meshes.

Costas Argyrides, Nikolaos Mavrogiannakis, Dhiraj K. Pradhan

Proceedings of the IEEE Computer Society Annual Symposium on VLSI, 2010

Improving reliability for bit parallel finite field multipliers using Decimal Hamming.

Nikolaos Mavrogiannakis, Costas Argyrides, Dhiraj K. Pradhan

Proceedings of the 2010 East-West Design & Test Symposium, 2010

Multiple Bit Error Detection and Correction in Memory.

J. F. Tarillo, Nikolaos Mavrogiannakis, Carlos Arthur Lang Lisbôa, Costas Argyrides, Luigi Carro

Proceedings of the 13th Euromicro Conference on Digital System Design, 2010

2009

Reliability aware yield improvement technique for nanotechnology based circuits.

Costas Argyrides, Giorgos Dimosthenous, Dhiraj K. Pradhan, Carlos Arthur Lang Lisbôa, Luigi Carro

Proceedings of the 22st Annual Symposium on Integrated Circuits and Systems Design: Chip on the Dunes, 2009

Single element correction in sorting algorithms with minimum delay overhead.

Costas Argyrides, Carlos Arthur Lang Lisbôa, Dhiraj K. Pradhan, Luigi Carro

Proceedings of the 10th Latin American Test Workshop, 2009

Increasing memory yield in future technologies through innovative design.

Costas Argyrides, Ahmad A. Al-Yamani, Carlos Arthur Lang Lisbôa, Luigi Carro, Dhiraj K. Pradhan

Proceedings of the 10th International Symposium on Quality of Electronic Design (ISQED 2009), 2009

A fast error correction technique for matrix multiplication algorithms.

Costas Argyrides, Carlos Arthur Lang Lisbôa, Dhiraj K. Pradhan, Luigi Carro

Proceedings of the 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 2009

2008

Algorithm Level Fault Tolerance: A Technique to Cope with Long Duration Transient Faults in Matrix Multiplication Algorithms.

Carlos Arthur Lang Lisbôa, Costas Argyrides, Dhiraj K. Pradhan, Luigi Carro

Proceedings of the 26th IEEE VLSI Test Symposium (VTS 2008), April 27, 2008

Single Error Correcting Finite Field Multipliers Over GF(2m).

Jimson Mathew, Costas Argyrides, Abusaleh M. Jabir, Hafizur Rahaman, Dhiraj K. Pradhan

Proceedings of the 21st International Conference on VLSI Design (VLSI Design 2008), 2008

Area Reliability Trade-Off in Improved Reed Muller Coding.

Costas Argyrides, Stephania Loizidou, Dhiraj K. Pradhan

Proceedings of the Embedded Computer Systems: Architectures, 2008

Embedding Current Monitoring in H-Tree RAM Architecture for Multiple SEU Tolerance and Reliability Improvement.

Costas Argyrides, Fabian Vargas, Marlon Moraes, Dhiraj K. Pradhan

Proceedings of the 14th IEEE International On-Line Testing Symposium (IOLTS 2008), 2008

Multiple Event Upsets Aware FPGAs Using Protected Schemes.

Costas Argyrides, Dhiraj K. Pradhan

Proceedings of the Fault-Tolerant Distributed Algorithms on VLSI Chips, 07.09., 2008

Yield improvement and power aware low cost memory chips.

Costas Argyrides, Stephania Loizidou Himona, Dhiraj K. Pradhan

Proceedings of the 5th Conference on Computing Frontiers, 2008

2007

Improved decoding algorithm for high reliable reed muller coding.

Costas Argyrides, Dhiraj K. Pradhan

Proceedings of the 2007 IEEE International SOC Conference, 2007

High defect tolerant low cost memory chips.

Costas Argyrides, Ahmad A. Al-Yamani, Dhiraj K. Pradhan

Proceedings of the 2007 IEEE International SOC Conference, 2007

A soft error robust and power aware memory design.

Costas Argyrides, Carlos Arthur Lang Lisbôa, Luigi Carro, Dhiraj K. Pradhan

Proceedings of the 20th Annual Symposium on Integrated Circuits and Systems Design, 2007

CLB-based Detection and Correction of Bit-flip faults in SRAM-based FPGAs.

Hamid R. Zarandi, Seyed Ghassem Miremadi, Costas Argyrides, Dhiraj K. Pradhan

Proceedings of the International Symposium on Circuits and Systems (ISCAS 2007), 2007

Multiple Upsets Tolerance in SRAM Memory.

Costas Argyrides, Hamid R. Zarandi, Dhiraj K. Pradhan

Proceedings of the International Symposium on Circuits and Systems (ISCAS 2007), 2007

Fast SEU Detection and Correction in LUT Configuration Bits of SRAM-based FPGAs.

Hamid R. Zarandi, Seyed Ghassem Miremadi, Costas Argyrides, Dhiraj K. Pradhan

Proceedings of the 21th International Parallel and Distributed Processing Symposium (IPDPS 2007), 2007

Highly Reliable Power Aware Memory Design.

Costas Argyrides, Dhiraj K. Pradhan

Proceedings of the 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 2007

Matrix Codes: Multiple Bit Upsets Tolerant Method for SRAM Memories.

Costas Argyrides, Hamid R. Zarandi, Dhiraj K. Pradhan

Proceedings of the 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007), 2007