Marta Bagatin

According to our database, Marta Bagatin authored at least 11 papers between 2007 and 2022.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2022

Radiation Tolerant Multi-Bit Flip-Flop System With Embedded Timing Pre-Error Sensing.

Abhishek Jain, Andrea Mario Veggetti, Dennis Crippa, Antonio Benfante, Simone Gerardin, Marta Bagatin

IEEE J. Solid State Circuits, 2022

2021

First Tests of a New Facility for Device-Level, Board-Level and System-Level Neutron Irradiation of Microelectronics.

Carlo Cazzaniga, Marta Bagatin, Simone Gerardin, Alessandra Costantino, Christopher D. Frost

IEEE Trans. Emerg. Top. Comput., 2021

2020

Single Phase Clock Based Radiation Tolerant D Flip-flop Circuit.

Abhishek Jain, Andrea Veggetti, Dennis Crippa, Antonio Benfante, Simone Gerardin, Marta Bagatin

Proceedings of the 26th IEEE International Symposium on On-Line Testing and Robust System Design, 2020

2015

Soft errors in floating gate memory cells: A review.

Marta Bagatin, Simone Gerardin

Microelectron. Reliab., 2015

CHIPIX65: Developments on a new generation pixel readout ASIC in CMOS 65 nm for HEP experiments.

N. Demaria, G. Dellacasa, G. Mazza, Angelo Rivetti, Manuel D. Da Rocha Rolo, E. Monteil, L. Pacher, Fabio Ciciriello, Francesco Corsi, Cristoforo Marzocca, G. De Roberts, F. Loddo, C. Tamma, Marta Bagatin, D. Bisello, Simone Gerardin, S. Mattiazzo, L. Ding, Piero Giubilato, Alessandro Paccagnella, Francesco De Canio, Luigi Gaioni, Massimo Manghisoni, Valerio Re, Gianluca Traversi, Elisa Riceputi, Lodovico Ratti, Carla Vacchi, Roberto Beccherle, Guido Magazzù, M. Minuti, Fabio Morsani, Fabrizio Palla, Valentino Liberali, Seyedruhollah Shojaii, Alberto Stabile, Gian Mario Bilei, Mauro Menichelli, Elia Conti, Sara Marconi, D. Passen, Pisana Placidi

Proceedings of the 6th International Workshop on Advances in Sensors and Interfaces, 2015

2014

Degradation of dc and pulsed characteristics of InAlN/GaN HEMTs under different proton fluences.

Isabella Rossetto, Fabiana Rampazzo, Simone Gerardin, Matteo Meneghini, Marta Bagatin, Alberto Zanandrea, Alessandro Paccagnella, Gaudenzio Meneghesso, Enrico Zanoni, Christian Dua, Marie-Antoinette di Forte-Poisson, Raphael Aubry, Mourad Oualli, Sylvain L. Delage

Proceedings of the 44th European Solid State Device Research Conference, 2014

2012

Temperature dependence of neutron-induced soft errors in SRAMs.

Marta Bagatin, Simone Gerardin, Alessandro Paccagnella, Carla Andreani, Giuseppe Gorini, C. D. Frost

Microelectron. Reliab., 2012

High-reliability fault tolerant digital systems in nanometric technologies: Characterization and design methodologies.

Cristiana Bolchini, Antonio Miele, Chiara Sandionigi, Marco Ottavi, Salvatore Pontarelli, Adelio Salsano, Cecilia Metra, Martin Omaña, Daniele Rossi, Matteo Sonza Reorda, Luca Sterpone, Massimo Violante, Simone Gerardin, Marta Bagatin, Alessandro Paccagnella

Proceedings of the 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2012

2010

Impact of total dose on heavy-ion upsets in floating gate arrays.

Simone Gerardin, Marta Bagatin, Alessandro Paccagnella, G. Cellere, Angelo Visconti, Mauro Bonanomi

Microelectron. Reliab., 2010

Destructive events in NAND Flash memories irradiated with heavy ions.

Marta Bagatin, Simone Gerardin, Alessandro Paccagnella, Giorgio Cellere, F. Irom, D. N. Nguyen

Microelectron. Reliab., 2010

2007

Single Event Effects in 1Gbit 90nm NAND Flash Memories under Operating Conditions.

Marta Bagatin, Giorgio Cellere, Simone Gerardin, Alessandro Paccagnella, Angelo Visconti, Silvia Beltrami, M. Maccarrone

Proceedings of the 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 2007