Veit Kleeberger

According to our database, Veit Kleeberger authored at least 15 papers between 2009 and 2018.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2018

Fault Injection for Test-Driven Development of Robust SoC Firmware.

Petra R. Maier, Veit B. Kleeberger, Daniel Mueller-Gritschneder, Ulf Schlichtmann

ACM Trans. Embed. Comput. Syst., 2018

2016

FinFET-based product performance: Modeling and evaluation of standard cells in FinFET technologies.

Shushanik Karapetyan, Veit Kleeberger, Ulf Schlichtmann

Microelectron. Reliab., 2016

Fault injection at host-compiled level with static fault set reduction for SoC firmware robustness testing.

Petra R. Maier, Veit Kleeberger, Daniel Mueller-Gritschneder, Ulf Schlichtmann

Proceedings of the Eleventh IEEE/ACM/IFIP International Conference on Hardware/Software Codesign and System Synthesis, 2016

Embedded software reliability testing by unit-level fault injection.

Petra R. Maier, Veit B. Kleeberger

Proceedings of the 21st Asia and South Pacific Design Automation Conference, 2016

2015

Application-aware cross-layer reliability analysis and optimization.

Michael Glaß, Hananeh Aliee, Liang Chen, Mojtaba Ebrahimi, Faramarz Khosravi, Veit B. Kleeberger, Alexandra Listl, Daniel Müller-Gritschneder, Fabian Oboril, Ulf Schlichtmann, Mehdi Baradaran Tahoori, Jürgen Teich, Norbert Wehn, Christian Weis

it Inf. Technol., 2015

Design & verification of automotive SoC firmware.

Veit B. Kleeberger, Stefan Rutkowski, Ruth Coppens

Proceedings of the 52nd Annual Design Automation Conference, 2015

2014

A compact model for NBTI degradation and recovery under use-profile variations and its application to aging analysis of digital integrated circuits.

Veit B. Kleeberger, Martin Barke, Christoph Werner, Doris Schmitt-Landsiedel, Ulf Schlichtmann

Microelectron. Reliab., 2014

Resilience Articulation Point (RAP): Cross-layer dependability modeling for nanometer system-on-chip resilience.

Andreas Herkersdorf, Hananeh Aliee, Michael Engel, Michael Glaß, Christina Gimmler-Dumont, Jörg Henkel, Veit Kleeberger, Michael A. Kochte, Johannes Maximilian Kühn, Daniel Mueller-Gritschneder, Sani R. Nassif, Holm Rauchfuss, Wolfgang Rosenstiel, Ulf Schlichtmann, Muhammad Shafique, Mehdi Baradaran Tahoori, Jürgen Teich, Norbert Wehn, Christian Weis, Hans-Joachim Wunderlich

Microelectron. Reliab., 2014

Connecting different worlds - Technology abstraction for reliability-aware design and Test.

Ulf Schlichtmann, Veit Kleeberger, Jacob A. Abraham, Adrian Evans, Christina Gimmler-Dumont, Michael Glaß, Andreas Herkersdorf, Sani R. Nassif, Norbert Wehn

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2014

Workload- and Instruction-Aware Timing Analysis: The missing Link between Technology and System-level Resilience.

Veit Kleeberger, Petra R. Maier, Ulf Schlichtmann

Proceedings of the 51st Annual Design Automation Conference 2014, 2014

2013

A Cross-Layer Technology-Based Study of How Memory Errors Impact System Resilience.

Veit Kleeberger, Christina Gimmler-Dumont, Christian Weis, Andreas Herkersdorf, Daniel Mueller-Gritschneder, Sani R. Nassif, Ulf Schlichtmann, Norbert Wehn

IEEE Micro, 2013

Technology-aware system failure analysis in the presence of soft errors by Mixture Importance Sampling.

Veit Kleeberger, Daniel Mueller-Gritschneder, Ulf Schlichtmann

Proceedings of the 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2013

Predicting future product performance: modeling and evaluation of standard cells in FinFET technologies.

Veit Kleeberger, Helmut E. Graeb, Ulf Schlichtmann

Proceedings of the 50th Annual Design Automation Conference 2013, 2013

2012

Schedulability Analysis for Processors with Aging-Aware Autonomic Frequency Scaling.

Alejandro Masrur, Philipp H. Kindt, Martin Becker, Samarjit Chakraborty, Veit Kleeberger, Martin Barke, Ulf Schlichtmann

Proceedings of the 2012 IEEE International Conference on Embedded and Real-Time Computing Systems and Applications, 2012

2009

Fast and waveform independent characterization of current source models.

Christoph Knoth, Veit B. Kleeberger, Petra Nordholz, Ulf Schlichtmann

Proceedings of the 2009 IEEE International Behavioral Modeling and Simulation Workshop, 2009