David F. Heidel

According to our database1, David F. Heidel authored at least 15 papers between 1998 and 2008.

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Bibliography

2008
New simulation methodology for effects of radiation in semiconductor chip structures.
IBM J. Res. Dev., 2008

Alpha-particle-induced upsets in advanced CMOS circuits and technology.
IBM J. Res. Dev., 2008

Preface.
IBM J. Res. Dev., 2008

Single-event-upset and alpha-particle emission rate measurement techniques.
IBM J. Res. Dev., 2008

2006
A pulsed low-voltage swing latch for reduced power dissipation in high-frequency microprocessors.
Proceedings of the 2006 International Symposium on Low Power Electronics and Design, 2006

Single-Event-Upset Trends in Advanced CMOS Technologies.
Proceedings of the 21th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2006), 2006

2005
An on-chip jitter measurement circuit with sub-picosecond resolution.
Proceedings of the 31st European Solid-State Circuits Conference, 2005

2003
Minimizing inductive noise in system-on-a-chip with multiple power gating structures.
Proceedings of the ESSCIRC 2003, 2003

2002
An overview of the BlueGene/L Supercomputer.
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Proceedings of the 2002 ACM/IEEE conference on Supercomputing, 2002


1999
Implementation of a self-resetting CMOS 64-bit parallel adder with enhanced testability.
IEEE J. Solid State Circuits, 1999

1998
A 1.0-GHz single-issue 64-bit powerPC integer processor.
IEEE J. Solid State Circuits, 1998


High-Speed Serializing/De-Serializing Design-For-Test Method for Evaluating a 1 GHz Microprocessor.
Proceedings of the 16th IEEE VLSI Test Symposium (VTS '98), 28 April, 1998

Design and implementation of high performance dynamic 64-bit parallel adder with enhanced testability.
Proceedings of the IEEE 1998 Custom Integrated Circuits Conference, 1998


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