Jeffrey B. Johnson

According to our database, Jeffrey B. Johnson authored at least 18 papers between 1995 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2023

UAV-Based Quantification of Dynamic Lahar Channel Morphology at Volcán de Fuego, Guatemala.

Jerry C. Mock, Jeffrey B. Johnson, Armando Pineda, Gustavo Bejar, Amilcar Roca

Remote. Sens., August, 2023

2022

Optimized LDMOS Offering for Power Management and RF Applications.

Salvatore Cimino, J. Singh, Jeffrey B. Johnson, W. Zheng, Y. Chen, W. Liu, P. Srinivasan, O. Gonzales, M. Hauser, Matthew Koskinen, K. Nagahiro, Y. Liu, B. Min, Tanya Nigam, N. Squib

Proceedings of the IEEE International Reliability Physics Symposium, 2022

2021

Unoccupied Aircraft Systems (UASs) Reveal the Morphological Changes at Stromboli Volcano (Italy) before, between, and after the 3 July and 28 August 2019 Paroxysmal Eruptions.

Riccardo Civico, Tullio Ricci, Piergiorgio Scarlato, Daniele Andronico, Massimo Cantarero, Brett B. Carr, Emanuela De Beni, Elisabetta Del Bello, Jeffrey B. Johnson, Ulrich Kueppers, Luca Pizzimenti, Markus Schmid, Karen Strehlow, Jacopo Taddeucci

Remote. Sens., 2021

SiGe HBTs with ${f_{T}/f_{\max}\, \sim\, 375/510GHz}$ Integrated in 45nm PDSOI CMOS.

John J. Pekarik, Vibhor Jain, Crystal Kenney, Judson Holt, Shweta Khokale, Sudesh Saroop, Jeffrey B. Johnson, Kenneth J. Stein, Viorel Ontalus, Christopher Durcan, Mona Nafari, Tayel Nesheiwat, Sangameshwar Saudari, Elahe Yarmoghaddam, Saloni Chaurasia, Alvin J. Joseph

Proceedings of the IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium, 2021

2020

Analyzing continuous infrasound from Stromboli volcano, Italy using unsupervised machine learning.

Alex J. C. Witsil, Jeffrey B. Johnson

Comput. Geosci., 2020

Thermal Characterization and TCAD Modeling of a Power Amplifier in 45RFSOI for 5G mmWave Applications.

Peter C. Paliwoda, Mohamed A. Rabie, Oscar D. Restrepo, Eduardo Cruz Silva, E. Kaltalioglu, Fernando Guarin, Kenneth Barnett, Jeffrey B. Johnson, William Taylor, Myra Boenke, Byoung Min

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

Understanding ESD Induced Thermal Mechanism in FinFETs Through Predictive TCAD Simulation.

Zhiqing Li, Baofu Zhu, Anindya Nath, Meng Miao, Alain Loiseau, You Li, Jeffrey B. Johnson, Souvick Mitra, Robert Gauthier

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

2019

Hot Carrier Reliability Improvement of Thicker Gate Oxide nFET Devices in Advanced FinFETs.

M. Iqbal Mahmud, Amit Gupta, Maria Toledano-Luque, N. Rao Mavilla, Jeffrey B. Johnson, P. Srinivasan, A. Zainuddin, S. Rao, Salvatore Cimino, Byoung Min, Tanya Nigam

Proceedings of the IEEE International Reliability Physics Symposium, 2019

High Performance and Yield for Super Steep Retrograde Wells (SSRW) by Well Implant / Si-based Epitaxy on Advanced Technology FinFETs.

U. Rana, D. P. Brunco, S. Raman, Dina H. Triyoso, M. W. Stoker, Jeffrey B. Johnson, Luigi Pantisano, K. D. Seo, M. Zhao, A. Reznicek, R. Krishnan, B. Moser, J. Freeman, L. Jang, Evgeny Kaganer

Proceedings of the Device Research Conference, 2019

2018

Bottom-up methodology for predictive simulations of self-heating in aggressively scaled process technologies.

D. Singh, Oscar D. Restrepo, P. P. Manik, N. Rao Mavilla, H. Zhang, Peter C. Paliwoda, S. Pinkett, Y. Deng, Eduardo Cruz Silva, Jeffrey B. Johnson, M. Bajaj, S. Furkay, Z. Chbili, A. Kerber, C. Christiansen, S. Narasimha, E. Maciejewski, S. Samavedam, C.-H. Lin

Proceedings of the IEEE International Reliability Physics Symposium, 2018

2015

Oxygen vacancy traps in Hi-K/Metal gate technologies and their potential for embedded memory applications.

Chandrasekharan Kothandaraman, X. Chen, Dan Moy, Dallas Lea, Sami Rosenblatt, Faraz Khan, Derek Leu, Toshiaki Kirihata, D. Ioannou, Giuseppe La Rosa, Jeffrey B. Johnson, Norman Robson, Subramanian S. Iyer

Proceedings of the IEEE International Reliability Physics Symposium, 2015

2006

Silicon CMOS devices beyond scaling.

Wilfried Haensch, Edward J. Nowak, Robert H. Dennard, Paul M. Solomon, Andres Bryant, Omer H. Dokumaci, Arvind Kumar, Xinlin Wang, Jeffrey B. Johnson, Massimo V. Fischetti

IBM J. Res. Dev., 2006

SiGe BiCMOS Trends - Today and Tomorrow.

James S. Dunn, David L. Harame, Alvin J. Joseph, Stephen A. St. Onge, Natalie B. Feilchenfeld, Louis D. Lanzerotti, Bradley A. Orner, Ephrem G. Gebreselasie, Jeffrey B. Johnson, Douglas D. Coolbaugh, Rick Rassel, Marwan Khater

Proceedings of the IEEE 2006 Custom Integrated Circuits Conference, 2006

2005

A novel CMOS compatible embedded nonvolatile memory with zero process adder.

Matthew J. Breitwisch, Chung Hon Lam, Jeffrey B. Johnson, Steven W. Mittl, Jian W. Zhu

Proceedings of the 13th IEEE International Workshop on Memory Technology, 2005

2004

Silicon-germanium BiCMOS HBT technology for wireless power amplifier applications.

Jeffrey B. Johnson, Alvin J. Joseph, David C. Sheridan, Ramana M. Maladi, Per-Olof Brandt, Jonas Persson, Jesper Andersson, Are Bjorneklett, Ulrika Persson, Fariborz Abasi, Lars Tilly

IEEE J. Solid State Circuits, 2004

2003

Product applications and technology directions with SiGe BiCMOS.

Alvin J. Joseph, James S. Dunn, Greg G. Freeman, David L. Harame, Douglas Coolbaugh, Robert A. Groves, Kenneth J. Stein, Rich Volant, Seshadri Subbanna, V. S. Marangos, Stephen St. Onge, Ebenezer Eshun, P. Cooper, Jeffrey B. Johnson, Jae-Sung Rieh, Basanth Jagannathan, Vidhya Ramachandran, David Ahlgren, Dawn Wang, X. Wang

IEEE J. Solid State Circuits, 2003

Design automation methodology and rf/analog modeling for rf CMOS and SiGe BiCMOS technologies.

David L. Harame, Kim M. Newton, Raminderpal Singh, Susan L. Sweeney, Sue E. Strang, Jeffrey B. Johnson, Scott M. Parker, Carl E. Dickey, Mete Erturk, Greg J. Schulberg, Donald L. Jordan, David C. Sheridan, Michael P. Keene, John Boquet, Robert A. Groves, Mukesh Kumar, Dean A. Herman Jr., Bernard S. Meyerson

IBM J. Res. Dev., 2003

1995

The evolution of IBM CMOS DRAM technology.

Eric Adler, John K. DeBrosse, Stephen F. Geissler, Steven J. Holmes, Mark D. Jaffe, Jeffrey B. Johnson, Charles W. Koburger III, Jerome B. Lasky, Brian Lloyd, Glen L. Miles, James S. Nakos, Wendell P. Noble Jr., Steven H. Voldman, Michael Armacost, Richard Ferguson

IBM J. Res. Dev., 1995