Liu Liu

Orcid: 0000-0003-3307-1596

Affiliations:
  • University of Notre Dame, Department of Computer Science and Engineering, Notre Dame, IN, USA


According to our database1, Liu Liu authored at least 15 papers between 2019 and 2026.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

Legend:

Book  In proceedings  Article  PhD thesis  Dataset  Other 

Links

Online presence:

On csauthors.net:

Bibliography

2026
EvaCAM: A Circuit-Level Evaluation Tool for General Content Addressable Memories.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., April, 2026

Efficient Approximation of Earth Mover's Distance Based on Nearest Neighbor Search.
IEEE Trans. Multim., 2026

Enhancing Robustness of Content-Addressable Memories for In-Memory Search.
Proceedings of the 44th IEEE VLSI Test Symposium, 2026

2025
Cross-Layer Design and Design Automation for In-Memory Computing Based on Nonvolatile Memory Technologies.
IEEE Des. Test, December, 2025

Invited Paper: Circuit and Architecture Design with Emerging Computing Paradigms.
Proceedings of the IEEE/ACM International Conference On Computer Aided Design, 2025

NVCiM-PT: An NVCiM-Assisted Prompt Tuning Framework for Edge LLMs.
Proceedings of the Design, Automation & Test in Europe Conference, 2025

2024
Design of High-Performance and Compact CAM for Supporting Data-Intensive Applications.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2024

TAP-CAM: A Tunable Approximate Matching Engine based on Ferroelectric Content Addressable Memory.
Proceedings of the 43rd IEEE/ACM International Conference on Computer-Aided Design, 2024

2023
A Reconfigurable FeFET Content Addressable Memory for Multi-State Hamming Distance.
IEEE Trans. Circuits Syst. I Regul. Pap., 2023

Compact and High-Performance TCAM Based on Scaled Double-Gate FeFETs.
CoRR, 2023

Invited Paper: Algorithm/Hardware Co-Design for Few-Shot Learning at the Edge.
Proceedings of the IEEE/ACM International Conference on Computer Aided Design, 2023

Cross Layer Design for the Predictive Assessment of Technology-Enabled Architectures.
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2023

Compact and High-Performance TCAM Based on Scaled Double-Gate FeFETs.
Proceedings of the 60th ACM/IEEE Design Automation Conference, 2023

2022
Eva-CAM: A Circuit/Architecture-Level Evaluation Tool for General Content Addressable Memories.
Proceedings of the 2022 Design, Automation & Test in Europe Conference & Exhibition, 2022

2019
A channel multiplexing digital calibration technique for timing mismatch of time-interleaved ADCs.
IEICE Electron. Express, 2019


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