Mounir Benabdenbi
  According to our database1,
  Mounir Benabdenbi
  authored at least 33 papers
  between 2000 and 2024.
  
  
Collaborative distances:
Collaborative distances:
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Bibliography
  2024
Combining Acceleration and Approximation in Dependable Edge AI: Optimization Methodology and Tools Applied to a Case Study.
    
  
    Proceedings of the IEEE International Conference on Design, 2024
    
  
  2021
    Proceedings of the IEEE Computer Society Annual Symposium on VLSI, 2021
    
  
  2020
    Proceedings of the 15th Design & Technology of Integrated Systems in Nanoscale Era, 2020
    
  
  2019
    Proceedings of the 14th International Conference on Design & Technology of Integrated Systems In Nanoscale Era, 2019
    
  
  2018
  2015
    Proceedings of the 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, 2015
    
  
  2014
On-the-Field Test and Configuration Infrastructure for 2-D-Mesh NoCs in Shared-Memory Many-Core Architectures.
    
  
    IEEE Trans. Very Large Scale Integr. Syst., 2014
    
  
Fault-tolerant adaptive routing under an unconstrained set of node and link failures for many-core systems-on-chip.
    
  
    Microprocess. Microsystems, 2014
    
  
Impact of Cluster Size on Routability, Testability and Robustness of a Cluster in a Mesh FPGA.
    
  
    Proceedings of the IEEE Computer Society Annual Symposium on VLSI, 2014
    
  
    Proceedings of the 2014 IEEE 20th International On-Line Testing Symposium, 2014
    
  
    Proceedings of the 10th European Workshop on Microelectronics Education (EWME), 2014
    
  
  2013
Fault-tolerant adaptive routing under permanent and temporary failures for many-core systems-on-chip.
    
  
    Proceedings of the 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), 2013
    
  
    Proceedings of the 2013 International Conference on Field-Programmable Technology, 2013
    
  
    Proceedings of the 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2013
    
  
  2012
CSL: Configurable Fault Tolerant Serial Links for Inter-die Communication in 3D Systems.
    
  
    J. Electron. Test., 2012
    
  
Kth-Aggressor Fault (KAF)-based Thru-Silicon-Via Interconnect Built-In Self-Test and Diagnosis.
    
  
    J. Electron. Test., 2012
    
  
    Proceedings of the IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2012
    
  
  2011
Localization of damaged resources in NoC based shared-memory MP2SOC, using a Distributed Cooperative Configuration Infrastructure.
    
  
    Proceedings of the 29th IEEE VLSI Test Symposium, 2011
    
  
    Proceedings of the 12th Latin American Test Workshop, 2011
    
  
  2010
Fully distributed initialization procedure for a 2D-Mesh NoC, including off-line BIST and partial deactivation of faulty components.
    
  
    Proceedings of the 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 2010
    
  
    Proceedings of the 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 2010
    
  
    Proceedings of the 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 2010
    
  
    Proceedings of the 15th European Test Symposium, 2010
    
  
    Proceedings of the IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W 2010), Chicago, Illinois, USA, June 28, 2010
    
  
    Proceedings of the 2010 Conference on Design & Architectures for Signal & Image Processing, 2010
    
  
  2009
    Proceedings of the 10th Latin American Test Workshop, 2009
    
  
  2007
    Proceedings of the 25th IEEE VLSI Test Symposium (VTS 2007), 2007
    
  
  2006
MP-SoC Architecture for an Obstacle Detection Application in Pre-Crash Situation.
  
    Proceedings of the 2nd International Workshop on Reconfigurable Communication-centric Systems-on-Chip, 2006
    
  
  2004
STEPS: Experimenting a New Software-Based Strategy for Testing SoCs Containing P1500-Compliant IP Cores.
    
  
    Proceedings of the 2004 Design, 2004
    
  
  2002
CAS-BUS: A Test Access Mechanism and a Toolbox Environment for Core-Based System Chip Testing.
    
  
    J. Electron. Test., 2002
    
  
  2001
    Proceedings of the Conference on Design, Automation and Test in Europe, 2001
    
  
  2000
    Proceedings of the 13th Annual Symposium on Integrated Circuits and Systems Design, 2000
    
  
    Proceedings of the 2000 Design, 2000