Matheus F. Pontes

According to our database, Matheus F. Pontes authored at least 5 papers between 2018 and 2022.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2022

The Impact of Logic Gates Susceptibility in Overall Circuit Reliability Analysis.

Matheus F. Pontes, Ingrid F. V. Oliveira, Rafael B. Schvittz, Leomar Soares da Rosa Jr., Paulo F. Butzen

Proceedings of the IEEE International Symposium on Circuits and Systems, 2022

Fault Tolerance Evaluation of Different Majority Voter Designs.

Ingrid F. V. Oliveira, Matheus F. Pontes, Rafael B. Schvittz, Leomar S. da Rosa Jr., Paulo F. Butzen, Rafael Iankowski Soares

Proceedings of the IEEE International Symposium on Circuits and Systems, 2022

2021

Logic Synthesis Meets Machine Learning: Trading Exactness for Generalization.

Shubham Rai, Walter Lau Neto, Yukio Miyasaka, Xinpei Zhang, Mingfei Yu, Qingyang Yi, Masahiro Fujita, Guilherme B. Manske, Matheus F. Pontes, Leomar S. da Rosa, Marilton S. de Aguiar, Paulo F. Butzen, Po-Chun Chien, Yu-Shan Huang, Hoa-Ren Wang, Jie-Hong R. Jiang, Jiaqi Gu, Zheng Zhao, Zixuan Jiang, David Z. Pan, Brunno A. Abreu, Isac de Souza Campos, Augusto Andre Souza Berndt, Cristina Meinhardt, Jônata Tyska Carvalho, Mateus Grellert, Sergio Bampi, Aditya Lohana, Akash Kumar, Wei Zeng, Azadeh Davoodi, Rasit Onur Topaloglu, Yuan Zhou, Jordan Dotzel, Yichi Zhang, Hanyu Wang, Zhiru Zhang, Valerio Tenace, Pierre-Emmanuel Gaillardon, Alan Mishchenko, Satrajit Chatterjee

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2021

2018

Reliability evaluation of circuits designed in multi- and single-stage versions.

Rafael B. Schvittz, Matheus F. Pontes, Cristina Meinhardt, Denis Teixeira Franco, Lirida A. B. Naviner, Leomar S. da Rosa, Paulo F. Butzen

Proceedings of the 9th IEEE Latin American Symposium on Circuits & Systems, 2018

The Suitability of the SPR-MP Method to Evaluate the Reliability of Logic Circuits.

Matheus F. Pontes, Paulo F. Butzen, Rafael B. Schvittz, Leomar S. da Rosa Jr., Denis Teixeira Franco

Proceedings of the 25th IEEE International Conference on Electronics, Circuits and Systems, 2018