Young Hoon Kwark

According to our database, Young Hoon Kwark authored at least 11 papers between 1999 and 2015.

Collaborative distances:

• Dijkstra number of three.
• Erdős number of four.

2015

A 1.4 pJ/bit, Power-Scalable 16×12 Gb/s Source-Synchronous I/O With DFE Receiver in 32 nm SOI CMOS Technology.

Timothy O. Dickson, Yong Liu, Sergey V. Rylov, Ankur Agrawal, Seongwon Kim, Ping-Hsuan Hsieh, John F. Bulzacchelli, Mark A. Ferriss, Herschel A. Ainspan, Alexander V. Rylyakov, Benjamin D. Parker, Michael P. Beakes, Christian W. Baks, Lei Shan, Young Hoon Kwark, José A. Tierno, Daniel J. Friedman

IEEE J. Solid State Circuits, 2015

2014

A 1.4-pJ/b, power-scalable 16×12-Gb/s source-synchronous I/O with DFE receiver in 32nm SOI CMOS technology.

Timothy O. Dickson, Yong Liu, Sergey V. Rylov, Ankur Agrawal, Seongwon Kim, Ping-Hsuan Hsieh, John F. Bulzacchelli, Mark A. Ferriss, Herschel A. Ainspan, Alexander V. Rylyakov, Benjamin D. Parker, Christian W. Baks, Lei Shan, Young Hoon Kwark, José A. Tierno, Daniel J. Friedman

Proceedings of the IEEE 2014 Custom Integrated Circuits Conference, 2014

2012

Electrical Performance of the Recessed Probe Launch Technique for Measurement of Embedded Multilayer Structures.

Miroslav Kotzev, Renato Rimolo-Donadio, Young Hoon Kwark, Christian W. Baks, Xiaoxiong Gu, Christian Schuster

IEEE Trans. Instrum. Meas., 2012

2008

Analysis and Optimization of the Recessed Probe Launch for High Frequency Measurements of PCB Interconnects.

Renato Rimolo-Donadio, Christian Schuster, Xiaoxiong Gu, Young Hoon Kwark, Mark B. Ritter

Proceedings of the Design, Automation and Test in Europe, 2008

2006

A 10-Gb/s 5-Tap DFE/4-Tap FFE Transceiver in 90-nm CMOS Technology.

John F. Bulzacchelli, Mounir Meghelli, Sergey V. Rylov, Woogeun Rhee, Alexander V. Rylyakov, Herschel A. Ainspan, Benjamin D. Parker, Michael P. Beakes, Aichin Chung, Troy J. Beukema, Petar K. Pepeljugoski, Lei Shan, Young Hoon Kwark, Sudhir M. Gowda, Daniel J. Friedman

IEEE J. Solid State Circuits, 2006

A 10Gb/s 5-Tap-DFE/4-Tap-FFE Transceiver in 90nm CMOS.

Mounir Meghelli, Sergey V. Rylov, John F. Bulzacchelli, Woogeun Rhee, Alexander V. Rylyakov, Herschel A. Ainspan, Benjamin D. Parker, Michael P. Beakes, Aichin Chung, Troy J. Beukema, Petar K. Pepeljugoski, L. Shan, Young Hoon Kwark, Sudhir M. Gowda, Daniel J. Friedman

Proceedings of the 2006 IEEE International Solid State Circuits Conference, 2006

2005

Development of next-generation system-on-package (SOP) technology based on silicon carriers with fine-pitch chip interconnection.

John U. Knickerbocker, Paul S. Andry, L. Paivikki Buchwalter, Alina Deutsch, Raymond R. Horton, Keith A. Jenkins, Young Hoon Kwark, Gerald McVicker, Chirag S. Patel, Robert J. Polastre, Christian D. Schuster, Arun Sharma, Sri M. Sri-Jayantha, Christopher W. Surovic, Cornelia K. Tsang, Bucknell C. Webb, Steven L. Wright, Samuel R. McKnight, Edmund J. Sprogis, Bing Dang

IBM J. Res. Dev., 2005

2003

SiGe BiCMOS integrated circuits for high-speed serial communication links.

Daniel J. Friedman, Mounir Meghelli, Benjamin D. Parker, Jungwook Yang, Herschel A. Ainspan, Alexander V. Rylyakov, Young Hoon Kwark, Mark B. Ritter, Lei Shan, Steven J. Zier, Michael Sorna, Mehmet Soyuer

IBM J. Res. Dev., 2003

45-Gb/s SiGe BiCMOS PRBS generator and PRBS checker [pseudorandom bit sequence].

Seongwon Kim, Mohit Kapur, Mounir Meghelli, Alexander V. Rylyakov, Young Hoon Kwark, Daniel J. Friedman

Proceedings of the IEEE Custom Integrated Circuits Conference, 2003

2000

Wide band home phone line characterization.

Duixian Liu, Ephraim B. Flint, Brian P. Gaucher, Young Hoon Kwark

IEEE Trans. Consumer Electron., 2000

1999

Wide band AC power line characterization.

Duixian Liu, Ephraim B. Flint, Brian P. Gaucher, Young Hoon Kwark

IEEE Trans. Consumer Electron., 1999