Bram Kruseman

According to our database, Bram Kruseman authored at least 32 papers between 1999 and 2016.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2016

ETS 2016 foreword.

Said Hamdioui, Giorgio Di Natale, Bram Kruseman, Maria K. Michael, Haralampos-G. D. Stratigopoulos

Proceedings of the 21th IEEE European Test Symposium, 2016

2015

Testing of Analog/Mixed Signal ICs: Past, present and future.

Bram Kruseman

Proceedings of the 20th IEEE European Test Symposium, 2015

2013

Diagnosis of Interconnect Full Open Defects in the Presence of Gate Leakage Currents.

Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2013

Panel session what is the electronics industry doing to win the battle against the expected scary failure rates in future technology nodes?

Said Hamdioui, Davide Appello, Arnaud Grasset, Xinli Gu, Bram Kruseman, Riccardo Mariani, Hermann Obermeir, Srikanth Venkataraman

Proceedings of the 18th IEEE European Test Symposium, 2013

2012

Diagnosis of Local Spot Defects in Analog Circuits.

Ke Huang, Haralampos-G. D. Stratigopoulos, Salvador Mir, Camelia Hora, Yizi Xing, Bram Kruseman

IEEE Trans. Instrum. Meas., 2012

NIM-X: A Noise Index Model-Based X-Filling Technique to Overcome the Power Supply Switching Noise Effects on Path Delay Test.

Elif Alpaslan, Bram Kruseman, Ananta K. Majhi, Wilmar M. Heuvelman, Jennifer Dworak

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2012

Defect Oriented Testing for Analog/Mixed-Signal Designs.

Bram Kruseman, Bratislav Tasic, Camelia Hora, Jos Dohmen, Hamidreza Hashempour, Maikel van Beurden, Yizi Xing

IEEE Des. Test Comput., 2012

2011

Gate Leakage Impact on Full Open Defects in Interconnect Lines.

Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman

IEEE Trans. Very Large Scale Integr. Syst., 2011

Diagnosis of Interconnect Full Open Defects in the Presence of Fan-Out.

Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2011

Defect Oriented Testing for analog/mixed-signal devices.

Bram Kruseman, Bratislav Tasic, Camelia Hora, Jos Dohmen, Hamidreza Hashempour, Maikel van Beurden, Yizi Xing

Proceedings of the 2011 IEEE International Test Conference, 2011

A Schematic-Based Extraction Methodology for Dislocation Defects in Analog/Mixed-Signal Devices.

Nivesh Rai, Hamidreza Hashempour, Yizi Xing, Bram Kruseman, Said Hamdioui

Proceedings of the 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2011

Test time reduction in analogue/mixed-signal devices by defect oriented testing: An industrial example.

Hamidreza Hashempour, Jos Dohmen, Bratislav Tasic, Bram Kruseman, Camelia Hora, Maikel van Beurden, Yizi Xing

Proceedings of the Design, Automation and Test in Europe, 2011

2010

Impact of Temperature on Test Quality.

Lavanya Jagan, Camelia Hora, Bram Kruseman, Stefan Eichenberger, Ananta K. Majhi, V. Kamakoti

Proceedings of the VLSI Design 2010: 23rd International Conference on VLSI Design, 2010

Diagnosis of full open defects in interconnect lines with fan-out.

Rosa Rodríguez-Montañés, Daniel Arumí, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman

Proceedings of the 15th European Test Symposium, 2010

NIM- a noise index model to estimate delay discrepancies between silicon and simulation.

Elif Alpaslan, Jennifer Dworak, Bram Kruseman, Ananta K. Majhi, Wilmar M. Heuvelman, Paul van de Wiel

Proceedings of the Design, Automation and Test in Europe, 2010

2008

Full Open Defects in Nanometric CMOS.

Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman

Proceedings of the 26th IEEE VLSI Test Symposium (VTS 2008), April 27, 2008

Time-dependent Behaviour of Full Open Defects in Interconnect Lines.

Rosa Rodríguez-Montañés, Daniel Arumí, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman

Proceedings of the 2008 IEEE International Test Conference, 2008

Towards a World Without Test Escapes: The Use of Volume Diagnosis to Improve Test Quality.

Stefan Eichenberger, Jeroen Geuzebroek, Camelia Hora, Bram Kruseman, Ananta K. Majhi

Proceedings of the 2008 IEEE International Test Conference, 2008

2007

Modeling Power Supply Noise in Delay Testing.

Jing Wang, Duncan M. Hank Walker, Xiang Lu, Ananta K. Majhi, Bram Kruseman, Guido Gronthoud, Luis Elvira Villagra, Paul J. A. M. van de Wiel, Stefan Eichenberger

IEEE Des. Test Comput., 2007

Diagnosis of Full Open Defects in Interconnecting Lines.

Rosa Rodríguez-Montañés, Daniel Arumí, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman, Maurice Lousberg, Ananta K. Majhi

Proceedings of the 25th IEEE VLSI Test Symposium (VTS 2007), 2007

On Performance Testing with Path Delay Patterns.

Bram Kruseman, Ananta K. Majhi, Guido Gronthoud

Proceedings of the 25th IEEE VLSI Test Symposium (VTS 2007), 2007

Diagnosis of Bridging Defects Based on Current Signatures at Low Power Supply Voltages.

Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman, Maurice Lousberg, Ananta K. Majhi

Proceedings of the 25th IEEE VLSI Test Symposium (VTS 2007), 2007

2006

Power Supply Noise in Delay Testing.

Jing Wang, D. M. H. Walker, Ananta K. Majhi, Bram Kruseman, Guido Gronthoud, Luis Elvira Villagra, Paul van de Wiel, Stefan Eichenberger

Proceedings of the 2006 IEEE International Test Conference, 2006

On test conditions for the detection of open defects.

Bram Kruseman, Manuel Heiligers

Proceedings of the Conference on Design, Automation and Test in Europe, 2006

2004

Trends in Testing Integrated Circuits.

Bart Vermeulen, Camelia Hora, Bram Kruseman, Erik Jan Marinissen, Robert Van Rijsinge

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

Systematic Defects in Deep Sub-Micron Technologies.

Bram Kruseman, Ananta K. Majhi, Camelia Hora, Stefan Eichenberger, Johan Meirlevede

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

On Hazard-free Patterns for Fine-delay Fault Testing.

Bram Kruseman, Ananta K. Majhi, Guido Gronthoud, Stefan Eichenberger

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

2003

Detection of Resistive Shorts in Deep Sub-micron Technologies.

Bram Kruseman, Stefan van den Oetelaar

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

2002

Comparison of IDDQ Testing and Very-Low Voltage Testing.

Bram Kruseman, Stefan van den Oetelaar, Josep Rius

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

2001

The future of delta I_DDQ testing.

Bram Kruseman, Rudger van Veen, Kees van Kaam

Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001

2000

Comparison of defect detection capabilities of current-based and voltage-based test methods.

Bram Kruseman

Proceedings of the 5th European Test Workshop, 2000

1999

Transient current testing of 0.25 μm CMOS devices.

Bram Kruseman, Peter Janssen, Victor Zieren

Proceedings of the Proceedings IEEE International Test Conference 1999, 1999