Shih-Hung Chen
Orcid: 0000-0002-6481-2951
According to our database1,
Shih-Hung Chen
authored at least 34 papers
between 2001 and 2025.
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Bibliography
2025
A 1.8-V GPIO With Design-Technology-Reliability Co-Optimization in Sub-3-nm GAA-NS Technology.
IEEE J. Solid State Circuits, February, 2025
2024
Insight into Latchup Risk in 28nm Planar Bulk Technology for Quantum Computing Applications.
Proceedings of the IEEE International Reliability Physics Symposium, 2024
A smart capacitive sensing garment can detect respiratory signals in various situations.
Proceedings of the IEEE International Conference on Consumer Electronics, 2024
Proceedings of the IEEE International Conference on Consumer Electronics, 2024
Proceedings of the IEEE International Conference on Consumer Electronics, 2024
Proceedings of the IEEE International Conference on Consumer Electronics, 2024
Proceedings of the IEEE International Conference on Consumer Electronics, 2024
2019
Concise Analytical Expression for Wunsch-Bell 1-D Pulsed Heating and Applications in ESD Using TLP.
Proceedings of the IEEE International Reliability Physics Symposium, 2019
CDM-Time Domain Turn-on Transient of ESD Diodes in Bulk FinFET and GAA NW Technologies.
Proceedings of the IEEE International Reliability Physics Symposium, 2019
Esd Challenges in Advanced Finfet and Gaa Nanowire cmos Technologies: Designing Diode Based ESD Protection in Advanced State of the Art Technologies.
Proceedings of the IEEE Custom Integrated Circuits Conference, 2019
2018
ESD diodes with Si/SiGe superlattice I/O finFET architecture in a vertically stacked horizontal nanowire technology.
Proceedings of the 48th European Solid-State Device Research Conference, 2018
2017
Proceedings of the 47th European Solid-State Device Research Conference, 2017
Tunable ESD clamp for high-voltage power I/O pins of a battery charge circuit in mobile applications.
Proceedings of the 47th European Solid-State Device Research Conference, 2017
2016
Impact of on- and off-chip protection on the transient-induced latch-up sensitivity of CMOS IC.
Microelectron. Reliab., 2016
2015
Proceedings of the Symposium on VLSI Circuits, 2015
Proceedings of the 2015 International Conference on IC Design & Technology, 2015
Proceedings of the 2015 International Conference on IC Design & Technology, 2015
A 0.7-1.15GHz complementary common-gate LNA in 0.18μm SOI CMOS with +15dBm IIP3 and >1kV HBM ESD protection.
Proceedings of the ESSCIRC Conference 2015, 2015
2013
Proceedings of the IEEE 37th Annual Computer Software and Applications Conference, 2013
Quasi-3D method: Time-efficient TCAD and mixed-mode simulations on finFET technologies.
Proceedings of the IEEE 2013 Custom Integrated Circuits Conference, 2013
2011
Dynamic Resource Allocation for Scalable H.264/AVC Video Transmission over MIMO Wireless Systems.
J. Signal Process. Syst., 2011
2010
Investigation on NMOS-based power-rail ESD clamp circuits with gate-driven mechanism in a 0.13-µm CMOS technology.
Microelectron. Reliab., 2010
2009
Area-Efficient ESD-Transient Detection Circuit With Smaller Capacitance for On-Chip Power-Rail ESD Protection in CMOS ICs.
IEEE Trans. Circuits Syst. II Express Briefs, 2009
Transmission Rate Enhancement for Scalable H.264/AVC Video over MIMO Wireless Systems.
Proceedings of the Advances in Multimedia Information Processing, 2009
2008
Optimization on NMOS-based power-rail ESD clamp circuits with gate-driven mechanism in a 0.13-μm CMOS technology.
Proceedings of the 15th IEEE International Conference on Electronics, Circuits and Systems, 2008
Active ESD protection design against cross-power-domain ESD stresses in CMOS integrated circuits.
Proceedings of the IEEE Asia Pacific Conference on Circuits and Systems, 2008
2007
Active ESD protection circuit design against charged-device-model ESD event in CMOS integrated circuits.
Microelectron. Reliab., 2007
Implementation of Initial-On ESD Protection Concept With PMOS-Triggered SCR Devices in Deep-Submicron CMOS Technology.
IEEE J. Solid State Circuits, 2007
2006
Failure analysis and solutions to overcome latchup failure event of a power controller IC in bulk CMOS technology.
Microelectron. Reliab., 2006
2005
Investigation on seal-ring rules for IC product reliability in 0.25-mum CMOS technology.
Microelectron. Reliab., 2005
Employing split-band technique and optical SSB filter to Improve directly modulated fiber optical CATV system performances.
IEICE Electron. Express, 2005
2003
Proceedings of the IEEE International Conference on Systems, 2003
2001
Int. J. Comput. Eng. Sci., 2001