Trong Huynh Bao

According to our database, Trong Huynh Bao authored at least 7 papers between 2013 and 2019.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2019

Process, Circuit and System Co-optimization of Wafer Level Co-Integrated FinFET with Vertical Nanosheet Selector for STT-MRAM Applications.

Trong Huynh Bao, Anabela Veloso, Sushil Sakhare, Philippe Matagne, Julien Ryckaert, Manu Perumkunnil, Davide Crotti, Farrukh Yasin, Alessio Spessot, Arnaud Furnémont, Gouri Sankar Kar, Anda Mocuta

Proceedings of the 56th Annual Design Automation Conference 2019, 2019

2017

Statistical Timing Analysis Considering Device and Interconnect Variability for BEOL Requirements in the 5-nm Node and Beyond.

Trong Huynh Bao, Julien Ryckaert, Zsolt Tokei, Abdelkarim Mercha, Diederik Verkest, Aaron Voon-Yew Thean, Piet Wambacq

IEEE Trans. Very Large Scale Integr. Syst., 2017

Cross-layer design and analysis of a low power, high density STT-MRAM for embedded systems.

Manu Komalan, Sushil Sakhare, Trong Huynh Bao, Siddharth Rao, Woojin Kim, Christian Tenllado, José Ignacio Gómez, Gouri Sankar Kar, Arnaud Furnémont, Francky Catthoor

Proceedings of the IEEE International Symposium on Circuits and Systems, 2017

SRAM designs for 5nm node and beyond: Opportunities and challenges.

Trong Huynh Bao, Sushil Sakhare, Julien Ryckaert, Alessio Spessot, Diederik Verkest, Anda Mocuta

Proceedings of the 2017 IEEE International Conference on IC Design and Technology, 2017

2015

Design technology co-optimization for enabling 5nm gate-all-around nanowire 6T SRAM.

Trong Huynh Bao, Sushil Sakhare, Julien Ryckaert, Dmitry Yakimets, Abdelkarim Mercha, Diederik Verkest, Aaron Voon-Yew Thean, Piet Wambacq

Proceedings of the 2015 International Conference on IC Design & Technology, 2015

2014

Circuit and process co-design with vertical gate-all-around nanowire FET technology to extend CMOS scaling for 5nm and beyond technologies.

Trong Huynh Bao, Dmitry Yakimets, Julien Ryckaert, Ivan Ciofi, Rogier Baert, Anabela Veloso, Jürgen Bömmels, Nadine Collaert, Philippe Roussel, S. Demuynck, Praveen Raghavan, Abdelkarim Mercha, Zsolt Tokei, Diederik Verkest, Aaron Thean, Piet Wambacq

Proceedings of the 44th European Solid State Device Research Conference, 2014

2013

ZipStream: Improving dependability in dynamic partial reconfiguration.

Stefano Di Carlo, Giulio Gambardella, Trong Huynh Bao, Paolo Prinetto, Daniele Rolfo, Pascal Trotta

Proceedings of the 8th International Design and Test Symposium, 2013