Halil Kukner

According to our database, Halil Kukner authored at least 18 papers between 2009 and 2022.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2022

RISC-V Processor Trace Encoder with Multiple Instructions Retirement Support.

Halil Kükner, Gökhan Kaplayan, Ahmet Efe, Mehmet Ali Gülden

Proceedings of the 30th IFIP/IEEE 30th International Conference on Very Large Scale Integration, 2022

2017

Integral Impact of BTI, PVT Variation, and Workload on SRAM Sense Amplifier.

Innocent Agbo, Mottaqiallah Taouil, Daniel Kraak, Said Hamdioui, Halil Kukner, Pieter Weckx, Praveen Raghavan, Francky Catthoor

IEEE Trans. Very Large Scale Integr. Syst., 2017

2015

Comparison of NBTI aging on adder architectures and ring oscillators in the downscaling technology nodes.

Halil Kükner, Pieter Weckx, Sébastien Morrison, Jacopo Franco, Maria Toledano-Luque, Moonju Cho, Praveen Raghavan, Ben Kaczer, Doyoung Jang, Kenichi Miyaguchi, Marie Garcia Bardon, Francky Catthoor, Liesbet Van der Perre, Rudy Lauwereins, Guido Groeseneken

Microprocess. Microsystems, 2015

Integral impact of BTI and voltage temperature variation on SRAM sense amplifier.

Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Halil Kukner, Pieter Weckx, Praveen Raghavan, Francky Catthoor

Proceedings of the 33rd IEEE VLSI Test Symposium, 2015

The defect-centric perspective of device and circuit reliability - From individual defects to circuits.

Ben Kaczer, Jacopo Franco, Pieter Weckx, Philippe Roussel, Erik Bury, Moonju Cho, Robin Degraeve, Dimitri Linten, Guido Groeseneken, Halil Kukner, Praveen Raghavan, Francky Catthoor, Gerhard Rzepa, Wolfgang Gös, Tibor Grasser

Proceedings of the 45th European Solid State Device Research Conference, 2015

2014

Degradation analysis of datapath logic subblocks under NBTI aging in FinFET technology.

Halil Kukner, Moustafa A. Khatib, Sebastien Morrison, Pieter Weckx, Praveen Raghavan, Ben Kaczer, Francky Catthoor, Liesbet Van der Perre, Rudy Lauwereins, Guido Groeseneken

Proceedings of the Fifteenth International Symposium on Quality Electronic Design, 2014

Modelling and mitigation of time-zero variability in sub-16nm finfet-based STT-MRAM memories.

Matthias Hartmann, Halil Kükner, Prashant Agrawal, Praveen Raghavan, Liesbet Van der Perre, Wim Dehaene

Proceedings of the Great Lakes Symposium on VLSI 2014, GLSVLSI '14, Houston, TX, USA - May 21, 2014

NBTI Aging on 32-Bit Adders in the Downscaling Planar FET Technology Nodes.

Halil Kukner, Pieter Weckx, Sebastien Morrison, Praveen Raghavan, Ben Kaczer, Francky Catthoor, Liesbet Van der Perre, Rudy Lauwereins, Guido Groeseneken

Proceedings of the 17th Euromicro Conference on Digital System Design, 2014

Bias Temperature Instability analysis of FinFET based SRAM cells.

Seyab Khan, Innocent Agbo, Said Hamdioui, Halil Kukner, Ben Kaczer, Praveen Raghavan, Francky Catthoor

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2014

2013

Impact of duty factor, stress stimuli, gate and drive strength on gate delay degradation with an atomistic trap-based BTI model.

Halil Kükner, Pieter Weckx, Praveen Raghavan, Ben Kaczer, Francky Catthoor, Liesbet Van der Perre, Rudy Lauwereins, Guido Groeseneken

Microprocess. Microsystems, 2013

Impact of partial resistive defects and Bias Temperature Instability on SRAM decoder reliablity.

Seyab Khan, Mottaqiallah Taouil, Said Hamdioui, Halil Kukner, Praveen Raghavan, Francky Catthoor

Proceedings of the 8th International Design and Test Symposium, 2013

Bias temperature instability analysis in SRAM decoder.

Seyab Khan, Said Hamdioui, Halil Kukner, Praveen Raghavan, Francky Catthoor

Proceedings of the 18th IEEE European Test Symposium, 2013

2012

Impact of Duty Factor, Stress Stimuli, and Gate Drive Strength on Gate Delay Degradation with an Atomistic Trap-Based BTI Model.

Halil Kukner, Pieter Weckx, Praveen Raghavan, Ben Kaczer, Francky Catthoor, Liesbet Van der Perre, Rudy Lauwereins, Guido Groeseneken

Proceedings of the 15th Euromicro Conference on Digital System Design, 2012

Incorporating parameter variations in BTI impact on nano-scale logical gates analysis.

Seyab Khan, Said Hamdioui, Halil Kukner, Praveen Raghavan, Francky Catthoor

Proceedings of the 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2012

BTI impact on logical gates in nano-scale CMOS technology.

Seyab Khan, Said Hamdioui, Halil Kukner, Praveen Raghavan, Francky Catthoor

Proceedings of the IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2012

2011

Generic, orthogonal and low-cost March Element based memory BIST.

Ad J. van de Goor, Said Hamdioui, Halil Kukner

Proceedings of the 2011 IEEE International Test Conference, 2011

2009

Dynamically variable step search motion estimation algorithm and a dynamically reconfigurable hardware for its implementation.

Ozgur Tasdizen, Abdulkadir Akin, Halil Kukner, Ilker Hamzaoglu

IEEE Trans. Consumer Electron., 2009

A high performance reconfigurable Motion Estimation hardware architecture.

Ozgur Tasdizen, Halil Kukner, Abdulkadir Akin, Ilker Hamzaoglu

Proceedings of the Design, Automation and Test in Europe, 2009