Frank Lee
Affiliations:- Taiwan Semiconductor Manufacturing Company (TSMC), Hsinchu, Taiwan
According to our database1,
Frank Lee
authored at least 15 papers
between 2012 and 2025.
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Bibliography
2025
Proceedings of the Optical Fiber Communications Conference and Exhibition, 2025
2024
An On-Chip Current-Sink-Free Adaptive-Timing Power Impedance Measurement (PIM) Unit for 3D-IC in 5nm FinFET Technology.
Proceedings of the IEEE Symposium on VLSI Technology and Circuits 2024, 2024
A 0.296pJ/bit 17.9Tb/s/mm<sup>2</sup> Die-to-Die Link in 5nm/6nm FinFET on a 9μm-Pitch 3D Package Achieving 10.24Tb/s Bandwidth at 16Gb/s PAM-4.
Proceedings of the IEEE Symposium on VLSI Technology and Circuits 2024, 2024
Proceedings of the IEEE International Test Conference, 2024
Proceedings of the IEEE International Test Conference, 2024
Scan Design Using Unsupervised Machine Learning to Reduce Functional Timing and Area Impact.
Proceedings of the IEEE European Test Symposium, 2024
2021
Proceedings of the ISPD '21: International Symposium on Physical Design, 2021
Energy Efficient Design Through Design and Technology Co-Optimization Near the Finish Line of CMOS Scaling.
Proceedings of the IEEE Asian Solid-State Circuits Conference, 2021
2020
IEEE J. Solid State Circuits, 2020
2019
A 7nm 4GHz Arm<sup>®</sup>-core-based CoWoS<sup>®</sup> Chiplet Design for High Performance Computing.
Proceedings of the 2019 Symposium on VLSI Circuits, Kyoto, Japan, June 9-14, 2019, 2019
2015
Efficient observation-point insertion for diagnosability enhancement in digital circuits.
Proceedings of the 2015 IEEE International Test Conference, 2015
2014
Design-for-diagnosis: Your safety net in catching design errors in known good dies in CoWoS<sup>TM</sup>/3D ICs.
Proceedings of the Technical Papers of 2014 International Symposium on VLSI Design, 2014
2013
Test and debug strategy for TSMC CoWoS™ stacking process based heterogeneous 3D IC: A silicon case study.
Proceedings of the 2013 IEEE International Test Conference, 2013
Proceedings of the 18th Asia and South Pacific Design Automation Conference, 2013
2012
DfT architecture and ATPG for Interconnect tests of JEDEC Wide-I/O memory-on-logic die stacks.
Proceedings of the 2012 IEEE International Test Conference, 2012