G. Cardoso Medeiros

According to our database, G. Cardoso Medeiros authored at least 27 papers between 2015 and 2022.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2022

Defects, Fault Modeling, and Test Development Framework for RRAMs.

Moritz Fieback, Guilherme Cardoso Medeiros, Lizhou Wu, Hassen Aziza, Rajendra Bishnoi, Mottaqiallah Taouil, Said Hamdioui

ACM J. Emerg. Technol. Comput. Syst., 2022

Hierarchical Memory Diagnosis.

Guilherme Cardoso Medeiros, Moritz Fieback, Anteneh Gebregiorgis, Mottaqiallah Taouil, Letícia Maria Veiras Bolzani, Said Hamdioui

Proceedings of the IEEE European Test Symposium, 2022

PVT Analysis for RRAM and STT-MRAM-based Logic Computation-in-Memory.

Moritz Fieback, Christopher Münch, Anteneh Gebregiorgis, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Said Hamdioui, Mehdi B. Tahoori

Proceedings of the IEEE European Test Symposium, 2022

2021

Hard-to-Detect Fault Analysis in FinFET SRAMs.

Guilherme Cardoso Medeiros, Moritz Fieback, Lizhou Wu, Mottaqiallah Taouil, Letícia Maria Bolzani Poehls, Said Hamdioui

IEEE Trans. Very Large Scale Integr. Syst., 2021

Defect and Fault Modeling Framework for STT-MRAM Testing.

Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Guilherme Cardoso Medeiros, Moritz Fieback, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui

IEEE Trans. Emerg. Top. Comput., 2021

Evaluation of Single Event Upset Susceptibility of FinFET-based SRAMs with Weak Resistive Defects.

Thiago Copetti, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Said Hamdioui, Letícia Maria Bolzani Poehls, Tiago Roberto Balen

J. Electron. Test., 2021

Detecting Random Read Faults to Reduce Test Escapes in FinFET SRAMs.

G. Cardoso Medeiros, Moritz Fieback, Anteneh Gebregiorgis, Mottaqiallah Taouil, Leticia Bolzani Poehls, Said Hamdioui

Proceedings of the 26th IEEE European Test Symposium, 2021

Intermittent Undefined State Fault in RRAMs.

Moritz Fieback, Guilherme Cardoso Medeiros, Anteneh Gebregiorgis, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui

Proceedings of the 26th IEEE European Test Symposium, 2021

Improving the Detection of Undefined State Faults in FinFET SRAMs.

G. Cardoso Medeiros, Moritz Fieback, Thiago Santos Copetti, Anteneh Gebregiorgis, Mottaqiallah Taouil, Leticia B. Poehls, Said Hamdioui

Proceedings of the 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, 2021

Modeling Soft-Error Reliability Under Variability.

Aneesh Balakrishnan, Guilherme Cardoso Medeiros, Cemil Cem Gürsoy, Said Hamdioui, Maksim Jenihhin, Dan Alexandrescu

Proceedings of the 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2021

2020

Evaluating the Impact of Ionizing Particles on FinFET -based SRAMs with Weak Resistive Defects.

Thiago Copetti, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Said Hamdioui, Leticia Bolzani Poehls, Tiago R. Balen

Proceedings of the IEEE Latin-American Test Symposium, 2020

A DFT Scheme to Improve Coverage of Hard-to-Detect Faults in FinFET SRAMs.

Guilherme Cardoso Medeiros, Cemil Cem Gürsoy, Lizhou Wu, Moritz Fieback, Maksim Jenihhin, Mottaqiallah Taouil, Said Hamdioui

Proceedings of the 2020 Design, Automation & Test in Europe Conference & Exhibition, 2020

2019

Evaluating the Impact of Temperature on Dynamic Fault Behaviour of FinFET-Based SRAMs with Resistive Defects.

G. Cardoso Medeiros, E. Brum, Leticia Bolzani Poehls, Thiago Copetti, Tiago R. Balen

J. Electron. Test., 2019

Device-Aware Test: A New Test Approach Towards DPPB Level.

Moritz Fieback, Lizhou Wu, Guilherme Cardoso Medeiros, Hassen Aziza, Siddharth Rao, Erik Jan Marinissen, Mottaqiallah Taouil, Said Hamdioui

Proceedings of the IEEE International Test Conference, 2019

Pinhole Defect Characterization and Fault Modeling for STT-MRAM Testing.

Lizhou Wu, Siddharth Rao, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Erik Jan Marinissen, Farrukh Yasin, Sebastien Couet, Said Hamdioui, Gouri Sankar Kar

Proceedings of the 24th IEEE European Test Symposium, 2019

DFT Scheme for Hard-to-Detect Faults in FinFET SRAMs.

Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Moritz Fieback, Leticia Bolzani Poehls, Said Hamdioui

Proceedings of the 24th IEEE European Test Symposium, 2019

2018

A defect-oriented test approach using on-Chip current sensors for resistive defects in FinFET SRAMs.

G. Cardoso Medeiros, Letícia Maria Veiras Bolzani, Mottaqiallah Taouil, Fabian Vargas, Said Hamdioui

Microelectron. Reliab., 2018

A hardware-based approach for SEU monitoring in SRAMs with weak resistive defects.

George Redivo Pinto, Guilherme Cardoso Medeiros, Fabian Vargas, Leticia Bolzani Poehls

Proceedings of the 19th IEEE Latin-American Test Symposium, 2018

Influence of temperature on dynamic fault behavior due to resistive defects in FinFET-based SRAMs.

G. Cardoso Medeiros, E. Brum, Leticia Bolzani Poehls, Thiago Copetti, Tiago R. Balen

Proceedings of the 19th IEEE Latin-American Test Symposium, 2018

2017

Analysing NBTI Impact on SRAMs with Resistive Defects.

M. Tulio Martins, G. Cardoso Medeiros, Thiago Copetti, Fabian Vargas, Marcus Pohls

J. Electron. Test., 2017

Evaluating the Impact of Resistive Defects on FinFET-Based SRAMs.

Thiago Santos Copetti, Guilherme Cardoso Medeiros, Letícia Maria Bolzani Poehls, Tiago R. Balen

Proceedings of the VLSI-SoC: Opportunities and Challenges Beyond the Internet of Things, 2017

Analyzing the behavior of FinFET SRAMs with resistive defects.

Thiago Santos Copetti, Tiago R. Balen, Guilherme Cardoso Medeiros, Letícia Maria Bolzani Poehls

Proceedings of the 2017 IFIP/IEEE International Conference on Very Large Scale Integration, 2017

2016

Identification and Rejuvenation of NBTI-Critical Logic Paths in Nanoscale Circuits.

Maksim Jenihhin, Giovanni Squillero, Thiago Santos Copetti, Valentin Tihhomirov, Sergei Kostin, Marco Gaudesi, Fabian Vargas, Jaan Raik, Matteo Sonza Reorda, Leticia Bolzani Poehls, Raimund Ubar, Guilherme Cardoso Medeiros

J. Electron. Test., 2016

NBTI-Aware Design of Integrated Circuits: A Hardware-Based Approach for Increasing Circuits' Life Time.

Thiago Copetti, Guilherme Cardoso Medeiros, Leticia Bolzani Poehls, Fabian Vargas

J. Electron. Test., 2016

Analyzing the Impact of SEUs on SRAMs with Resistive-Bridge Defects.

G. Cardoso Medeiros, Letícia Maria Bolzani Pöhls, Fabian Vargas

Proceedings of the 29th International Conference on VLSI Design and 15th International Conference on Embedded Systems, 2016

Analyzing NBTI impact on SRAMs with resistive-open defects.

M. Tulio Martins, G. Cardoso Medeiros, Thiago Copetti, Fabian Vargas, Letícia Maria Bolzani Poehls

Proceedings of the 17th Latin-American Test Symposium, 2016

2015

NBTI-aware design of integrated circuits: a hardware-based approach.

Thiago Copetti, G. Cardoso Medeiros, Letícia Maria Bolzani Poehls, Fabian Vargas

Proceedings of the 16th Latin-American Test Symposium, 2015