Takefumi Yoshikawa

Orcid: 0000-0002-9256-4422

According to our database1, Takefumi Yoshikawa authored at least 25 papers between 2005 and 2023.

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Bibliography

2023
A 13-bit Radiation-Hardened SAR-ADC with Error Correction by Adaptive Topology Transformation.
Proceedings of the IEEE International Reliability Physics Symposium, 2023

2021
A Bit-Error Rate Measurement and Error Analysis of Wireline Data Transmission using Current Source Model for Single Event Effect under Irradiation Environment.
J. Electron. Test., 2021

Single-Sensor Gas Discrimination and Quantification Based on Novel Temperature Modulation Method.
Proceedings of the 2021 IEEE Sensors, Sydney, Australia, October 31 - Nov. 3, 2021, 2021

Gas Discrimination Based on Feature Patterns of Sensor Transient Extracted by Memristor with Resistance-Voltage Converter.
Proceedings of the 2021 IEEE Sensors, Sydney, Australia, October 31 - Nov. 3, 2021, 2021

2020
Effect of Complex Permeability on Circuit Parameters of CPW with Magnetic Noise Suppression Sheet.
IEICE Trans. Commun., 2020

A charge recycling stacked I/O in standard CMOS technology for wide TSV data bus.
IEICE Electron. Express, 2020

2019
Gas Discrimination Based on Single-Device Extraction of Transient Sensor Response by a MetalOxide Memristor Toward Olfactory Sensor Array.
Proceedings of the 2019 IEEE SENSORS, Montreal, QC, Canada, October 27-30, 2019, 2019

2017
Yield Enhancement of Face-to-Face Cu-Cu Bonding With Dual-Mode Transceivers in 3DICs.
IEEE Trans. Very Large Scale Integr. Syst., 2017

Session 23 overview: DRAM, MRAM & DRAM interfaces.
Proceedings of the 2017 IEEE International Solid-State Circuits Conference, 2017

2016
2.31-Gb/s/ch Area-Efficient Crosstalk Canceled Hybrid Capacitive Coupling Interconnect for 3-D Integration.
IEEE Trans. Very Large Scale Integr. Syst., 2016

F1: Designing secure systems: Manufacturing, circuits and architectures.
Proceedings of the 2016 IEEE International Solid-State Circuits Conference, 2016

2015
Session 17 overview: Embedded memory and DRAM I/O: Memory subcommittee.
Proceedings of the 2015 IEEE International Solid-State Circuits Conference, 2015

F2: Memory trends: From big data to wearable devices.
Proceedings of the 2015 IEEE International Solid-State Circuits Conference, 2015

2014
A 3-Gb/s/ch Simultaneous Bidirectional Capacitive Coupling Transceiver for 3DICs.
IEEE Trans. Circuits Syst. II Express Briefs, 2014

Timing margin enhancement technique for current mode interface.
IEICE Electron. Express, 2014

A jitter suppression technique against data pattern dependency on high-speed interfaces for highly integrated SoCs.
IEICE Electron. Express, 2014

2013
Design of self-biased fully differential receiver and crosstalk cancellation for capacitive coupled vertical interconnects in 3DICs.
Proceedings of the 2013 IEEE International Symposium on Circuits and Systems (ISCAS2013), 2013

2012
Design of Simultaneous Bi-Directional Transceivers Utilizing Capacitive Coupling for 3DICs in Face-to-Face Configuration.
IEEE J. Emerg. Sel. Topics Circuits Syst., 2012

2011
An Ultra-Wide Range Bi-Directional Transceiver With Adaptive Power Control Using Background Replica VCO Gain Calibration.
IEEE J. Solid State Circuits, 2011

Design of capacitive-coupling-based simultaneously bi-directional transceivers for 3DIC.
Proceedings of the 2011 IEEE International 3D Systems Integration Conference (3DIC), Osaka, Japan, January 31, 2011

2009
A 125-1250 MHz Process-Independent Adaptive Bandwidth Spread Spectrum Clock Generator With Digital Controlled Self-Calibration.
IEEE J. Solid State Circuits, 2009

2008
An Over-1-Gb/s Transceiver Core for Integration Into Large System-on-Chips for Consumer Electronics.
IEEE Trans. Very Large Scale Integr. Syst., 2008

Current-Mode Transceiver with Nonfeedback Clock Recovery Capability for Mobile Applications.
IEICE Trans. Electron., 2008

Transceiver Macro with Spread-Spectrum Clocking Capability for AC-Coupled Cable Interfaces.
IEICE Trans. Electron., 2008

2005
A Spread Spectrum Clock Generator Using Digital Tracking Scheme.
IEICE Trans. Electron., 2005


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