Anne E. Gattiker

According to our database, Anne E. Gattiker authored at least 44 papers between 1994 and 2019.

Collaborative distances:

• Dijkstra number of three.
• Erdős number of four.

2019

Accelerating Conversational Agents Built With Off-the-Shelf Modularized Services.

Jinho Lee, Inseok Hwang, Thomas Hubregtsen, Anne E. Gattiker, Christopher M. Durham

IEEE Pervasive Comput., 2019

Video-Text Compliance: Activity Verification Based on Natural Language Instructions.

Mayoore Jaiswal, H. Peter Hofstee, Valerie Chen, Suvadip Paul, Rogério Feris, Frank Liu, Anupama Jagannathan, Anne Gattiker, Inseok Hwang, Jinho Lee, Matthew Tong, Sahil Dureja, Soham Shah

Proceedings of the 2019 IEEE/CVF International Conference on Computer Vision Workshops, 2019

2018

SimplerVoice: A Key Message & Visual Description Generator System for Illiteracy.

Minh N. B. Nguyen, Samuel Thomas, Anne E. Gattiker, Sujatha Kashyap, Kush R. Varshney

CoRR, 2018

2017

SCI-FII: Speculative Conversational Interface Framework for Incremental Inference on Modularized Services.

Jinho Lee, Inseok Hwang, Thomas Hubregtsen, Anne E. Gattiker, Christopher M. Durham

Proceedings of the 18th IEEE International Conference on Mobile Data Management, 2017

2015

The 12-Core POWER8™ Processor With 7.6 Tb/s IO Bandwidth, Integrated Voltage Regulation, and Resonant Clocking.

Eric J. Fluhr, Steve Baumgartner, David W. Boerstler, John F. Bulzacchelli, Timothy Diemoz, Daniel Dreps, George English, Joshua Friedrich, Anne Gattiker, Tilman Gloekler, Christopher J. Gonzalez, Jason Hibbeler, Keith A. Jenkins, Yong Kim, Paul Muench, Ryan Nett, Jose Paredes, Juergen Pille, Donald W. Plass, Phillip J. Restle, Raphael Robertazzi, David Shan, David W. Siljenberg, Michael A. Sperling, Kevin Stawiasz, Gregory S. Still, Zeynep Toprak Deniz, James D. Warnock, Glen A. Wiedemeier, Victor V. Zyuban

IEEE J. Solid State Circuits, 2015

2014

Circuit and Physical Design of the zEnterprise™ EC12 Microprocessor Chips and Multi-Chip Module.

James D. Warnock, Yuen H. Chan, Hubert Harrer, Sean M. Carey, Gerard Salem, Doug Malone, Ruchir Puri, Jeffrey A. Zitz, Adam Jatkowski, Gerald Strevig, Ayan Datta, Anne Gattiker, Aditya Bansal, Guenter Mayer, Yiu-Hing Chan, Mark D. Mayo, David L. Rude, Leon J. Sigal, Thomas Strach, Howard H. Smith, Huajun Wen, Pak-kin Mak, Chung-Lung Kevin Shum, Donald W. Plass, Charles F. Webb

IEEE J. Solid State Circuits, 2014

Unstructured text: Test analysis techniques applied to non-test problems.

Anne Gattiker

Proceedings of the 32nd IEEE VLSI Test Symposium, 2014

Big data and test.

Anne Gattiker

Proceedings of the 2014 International Test Conference, 2014

2013

Big Data text-oriented benchmark creation for Hadoop.

Anne E. Gattiker, Fadi H. Gebara, H. Peter Hofstee, J. D. Hayes, A. Hylick

IBM J. Res. Dev., 2013

5.5GHz system z microprocessor and multi-chip module.

James D. Warnock, Yuen H. Chan, Hubert Harrer, David L. Rude, Ruchir Puri, Sean M. Carey, Gerard Salem, Guenter Mayer, Yiu-Hing Chan, Mark D. Mayo, Adam Jatkowski, Gerald Strevig, Leon J. Sigal, Ayan Datta, Anne Gattiker, Aditya Bansal, Doug Malone, Thomas Strach, Huajun Wen, Pak-kin Mak, Chung-Lung Kevin Shum, Donald W. Plass, Charles F. Webb

Proceedings of the 2013 IEEE International Solid-State Circuits Conference, 2013

Hardware Acceleration of an Efficient and Accurate Proton Therapy Monte Carlo.

Thomas H. Osiecki, Min-Yu Tsai, Anne E. Gattiker, Damir A. Jamsek, Sani R. Nassif, William Evan Speight, Cliff C. N. Sze

Proceedings of the International Conference on Computational Science, 2013

2012

Guest Editors' Introduction: Yield Learning Processes and Methods.

Anne E. Gattiker, Phil Nigh

IEEE Des. Test Comput., 2012

An oscillation-based test structure for timing information extraction.

Eun Jung Jang, Anne Gattiker, Sani R. Nassif, Jacob A. Abraham

Proceedings of the 30th IEEE VLSI Test Symposium, 2012

2011

Efficient and product-representative timing model validation.

Eun Jung Jang, Anne E. Gattiker, Sani R. Nassif, Jacob A. Abraham

Proceedings of the 29th IEEE VLSI Test Symposium, 2011

Invited paper: Yin and Yang of embedded sensors for post-scaling-era.

Anne Gattiker

Proceedings of the 29th IEEE VLSI Test Symposium, 2011

Using well/substrate bias manipulation to enhance voltage-test-based defect detection.

Anne E. Gattiker, Phil Nigh

Proceedings of the 2011 IEEE International Test Conference, 2011

Post-Silicon Timing Validation Method Using Path Delay Measurements.

Eun Jung Jang, Jaeyong Chung, Anne E. Gattiker, Sani R. Nassif, Jacob A. Abraham

Proceedings of the 20th IEEE Asian Test Symposium, 2011

2010

System-level impact of chip-level failure mechanisms and screens.

Anne Gattiker

Proceedings of the 2010 International Conference on Computer-Aided Design, 2010

2008

Unraveling Variability for Process/Product Improvement.

Anne Gattiker

Proceedings of the 2008 IEEE International Test Conference, 2008

Using test data to improve IC quality and yield.

Anne Gattiker

Proceedings of the 2008 International Conference on Computer-Aided Design, 2008

2007

Guest Editor's Introduction: Getting More Out of Test.

Anne Gattiker

IEEE Des. Test Comput., 2007

2006

High-performance CMOS variability in the 65-nm regime and beyond.

Kerry Bernstein, David J. Frank, Anne E. Gattiker, Wilfried Haensch, Brian L. Ji, Sani R. Nassif, Edward J. Nowak, Dale J. Pearson, Norman J. Rohrer

IBM J. Res. Dev., 2006

Getting More out of ITC.

Anne E. Gattiker

IEEE Des. Test Comput., 2006

Data Analysis Techniques for CMOS Technology Characterization and Product Impact Assessment.

Anne Gattiker, Manjul Bhushan, Mark B. Ketchen

Proceedings of the 2006 IEEE International Test Conference, 2006

IC failure mechanisms yesterday, today, tomorrow: implications from test to DFM.

Anne E. Gattiker

Proceedings of the 2006 International Symposium on Physical Design, 2006

2004

Random and Systematic Defect Analysis Using IDDQ Signature Analysis for Understanding Fails and Guiding Test Decisions.

Phil Nigh, Anne E. Gattiker

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

Diagnosis Meets Physical Failure Analysis: How Long can we Succeed?

Anne E. Gattiker

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

2003

Power supply transient signal analysis for defect-oriented test.

James F. Plusquellic, Abhishek Singh, Chintan Patel, Anne E. Gattiker

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2003

Deformations of IC Structure in Test and Yield Learning.

Wojciech Maly, Anne E. Gattiker, Thomas Zanon, Thomas J. Vogels, R. D. (Shawn) Blanton, Thomas M. Storey

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

2002

Modeling the Economics of Testing: A DFT Perspective.

Pranab K. Nag, Anne E. Gattiker, Sichao Wei, Ronald D. Blanton, Wojciech Maly

IEEE Des. Test Comput., 2002

Power Supply Transient Signal Analysis Under Real Process and Test Hardware Models.

Abhishek Singh, Jim Plusquellic, Anne E. Gattiker

Proceedings of the 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It's a Gamble, 28 April, 2002

Test structures for delay variability.

Duane S. Boning, Joseph Panganiban, Karen Gonzalez-Valentin, Sani R. Nassif, Chandler McDowell, Anne E. Gattiker, Frank Liu

Proceedings of the 8th ACM/IEEE International Workshop on Timing Issues in the Specification and Synthesis of Digital Systems, 2002

Static timing analysis based circuit-limited-yield estimation.

Anne E. Gattiker, Sani R. Nassif, Rashmi Dinakar, Chris Long

Proceedings of the 2002 International Symposium on Circuits and Systems, 2002

2001

Detecting delay faults using power supply transient signal analysis.

Abhishek Singh, Chintan Patel, Shirong Liao, James F. Plusquellic, Anne E. Gattiker

Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001

Timing Yield Estimation from Static Timing Analysis.

Anne E. Gattiker, Sani R. Nassif, Rashmi Dinakar, Chris Long

Proceedings of the 2nd International Symposium on Quality of Electronic Design (ISQED 2001), 2001

2000

Test method evaluation experiments and data.

Phil Nigh, Anne E. Gattiker

Proceedings of the Proceedings IEEE International Test Conference 2000, 2000

1998

Toward understanding "Iddq-only" fails.

Anne E. Gattiker, Wojciech Maly

Proceedings of the Proceedings IEEE International Test Conference 1998, 1998

Current signatures: application [to CMOS].

Anne E. Gattiker, Wojciech Maly

Proceedings of the Proceedings IEEE International Test Conference 1998, 1998

1997

Smart Substrate MCMs.

Anne E. Gattiker, Wojciech Maly

J. Electron. Test., 1997

To DFT or Not to DFT?

Sichao Wei, Pranab K. Nag, Ronald D. Blanton, Anne E. Gattiker, Wojciech Maly

Proceedings of the Proceedings IEEE International Test Conference 1997, 1997

Current Signatures: Application.

Anne E. Gattiker, Wojciech Maly

Proceedings of the Proceedings IEEE International Test Conference 1997, 1997

1996

Current signatures [VLSI circuit testing].

Anne E. Gattiker, Wojciech Maly

Proceedings of the 14th IEEE VLSI Test Symposium (VTS'96), April 28, 1996

1994

Smart-Substrate Multichip-Module Systems.

Wojciech Maly, Derek B. I. Feltham, Anne E. Gattiker, Mark D. Hobaugh, Kenneth Backus, Michael E. Thomas

IEEE Des. Test Comput., 1994

Feasibility Study of Smart Substrate Multichip Modules.

Anne E. Gattiker, Wojciech Maly

Proceedings of the Proceedings IEEE International Test Conference 1994, 1994