Dean Lewis

According to our database, Dean Lewis authored at least 54 papers between 2000 and 2015.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2015

A way to implement the electro-optical technique to inertial MEMS.

Kevin Melendez, A. Desmoulin, Kevin Sanchez, Philippe Perdu, Dean Lewis

Microelectron. Reliab., 2015

2014

A comprehensive study of the application of the EOP techniques on bipolar devices.

Mohamed Mehdi Rebaï, Frédéric Darracq, Jean-Paul Guillet, Elise Bernou, Kevin Sanchez, Philippe Perdu, Dean Lewis

Microelectron. Reliab., 2014

2013

Impact of negative bias temperature instability on the single-event upset threshold of a 65 nm SRAM cell.

I. El Moukhtari, Vincent Pouget, C. Larue, Frédéric Darracq, Dean Lewis, Philippe Perdu

Microelectron. Reliab., 2013

Characterization and modeling of laser-induced single-event burn-out in SiC power diodes.

Nogaye Mbaye, Vincent Pouget, Frédéric Darracq, Dean Lewis

Microelectron. Reliab., 2013

2012

Building the electrical model of the Photoelectric Laser Stimulation of a PMOS transistor in 90 nm technology.

Alexandre Sarafianos, Roxane Llido, Jean-Max Dutertre, Olivier Gagliano, Valerie Serradeil, Mathieu Lisart, Vincent Goubier, Assia Tria, Vincent Pouget, Dean Lewis

Microelectron. Reliab., 2012

Effects of 1064 nm laser on MOS capacitor.

R. Llido, Pascal Masson, Arnaud Régnier, Vincent Goubier, Gérald Haller, Vincent Pouget, Dean Lewis

Microelectron. Reliab., 2012

High performance thermography with InGaAs photon counting camera.

Guillaume Bascoul, Philippe Perdu, Maryse Béguin, Dean Lewis

Microelectron. Reliab., 2012

2011

Photoelectric Laser Stimulation applied to Latch-Up phenomenon and localization of parasitic transistors in an industrial failure analysis laboratory.

Roxane Llido, J. Gomez, Vincent Goubier, N. Froidevaux, L. Dufayard, Gérald Haller, Vincent Pouget, Dean Lewis

Microelectron. Reliab., 2011

Magnetic field spatial Fourier analysis: A new opportunity for high resolution current localization.

Fulvio Infante, Philippe Perdu, H. B. Kor, Chee Lip Gan, Dean Lewis

Microelectron. Reliab., 2011

LVI detection on passive structure in advance CMOS technology: New opportunities for device analysis.

Guillaume Celi, Sylvain Dudit, Thierry Parrassin, Philippe Perdu, Antoine Reverdy, Dean Lewis, Michel Vallet

Microelectron. Reliab., 2011

Time Resolved Imaging: From logical states to events, a new and efficient pattern matching method for VLSI analysis.

Guillaume Bascoul, Philippe Perdu, A. Benigni, Sylvain Dudit, Guillaume Celi, Dean Lewis

Microelectron. Reliab., 2011

2010

Magnetic microscopy for ground plane current detection: a fast and reliable technique for current leakage localization by means of magnetic simulations.

Fulvio Infante, Philippe Perdu, Dean Lewis

Microelectron. Reliab., 2010

CADless laser assisted methodologies for failure analysis and device reliability.

A. Deyine, Kevin Sanchez, Philippe Perdu, F. Battistella, Dean Lewis

Microelectron. Reliab., 2010

Facing the defect characterization and localization challenges of bridge defects on a submicronic technology (45 nm and below).

Guillaume Celi, Sylvain Dudit, Philippe Perdu, Antoine Reverdy, Thierry Parrassin, Emmanuel Bechet, Dean Lewis, Michel Vallet

Microelectron. Reliab., 2010

2009

Editorial.

Dean Lewis, Nathalie Labat

Microelectron. Reliab., 2009

Magnetic microscopy for 3D devices: Defect localization with high resolution and long working distance on complex system in package.

Fulvio Infante, Philippe Perdu, Dean Lewis

Microelectron. Reliab., 2009

Net integrity checking by optical localization techniques.

Gérald Haller, Aziz Machouat, Dean Lewis, Vincent Pouget

Microelectron. Reliab., 2009

Electrical modeling of the effect of beam profile for pulsed laser fault injection.

C. Godlewski, Vincent Pouget, Dean Lewis, Mathieu Lisart

Microelectron. Reliab., 2009

2008

Failure Analysis enhancement by evaluating the Photoelectric Laser Stimulation impact on mixed-mode ICs.

Magdalena Sienkiewicz, Philippe Perdu, Abdellatif Firiti, Kevin Sanchez, Olivier Crépel, Dean Lewis

Microelectron. Reliab., 2008

Effect of physical defect on shmoos in CMOS DSM technologies.

Aziz Machouat, Gérald Haller, Vincent Goubier, Dean Lewis, Philippe Perdu, Vincent Pouget, Pascal Fouillat, Fabien Essely

Microelectron. Reliab., 2008

Generic simulator for faulty IC.

Julie Ferrigno, Aziz Machouat, Philippe Perdu, Dean Lewis, Gérald Haller, Vincent Goubier

Microelectron. Reliab., 2008

Dynamic Testing of an SRAM-Based FPGA by Time-Resolved Laser Fault Injection.

Vincent Pouget, Alexandre Douin, Gilles Foucard, Paul Peronnard, Dean Lewis, Pascal Fouillat, Raoul Velazco

Proceedings of the 14th IEEE International On-Line Testing Symposium (IOLTS 2008), 2008

2007

Identification of process/design issues during 0.18 µm technology qualification for space application.

Julie Ferrigno, Philippe Perdu, Kevin Sanchez, Dean Lewis

Proceedings of the 2007 Design, Automation and Test in Europe Conference and Exposition, 2007

2006

Application of various optical techniques for ESD defect localization.

Fabien Essely, Frédéric Darracq, Vincent Pouget, Mustapha Remmach, Felix Beaudoin, Nicolas Guitard, Marise Bafleur, Philippe Perdu, André Touboul, Dean Lewis

Microelectron. Reliab., 2006

Time resolved imaging using synchronous picosecond Photoelectric Laser Stimulation.

Alexandre Douin, Vincent Pouget, M. De Matos, Dean Lewis, Philippe Perdu, Pascal Fouillat

Microelectron. Reliab., 2006

2005

NIR laser stimulation for dynamic timing analysis.

Kevin Sanchez, Romain Desplats, Felix Beaudoin, Philippe Perdu, J. P. Roux, G. Woods, Dean Lewis

Microelectron. Reliab., 2005

Light Emission to Time Resolved Emission For IC Debug and Failure Analysis.

Mustapha Remmach, A. Pigozzi, Romain Desplats, Philippe Perdu, Dean Lewis, J. Noel, Sylvain Dudit

Microelectron. Reliab., 2005

Different Failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure.

Nicolas Guitard, Fabien Essely, David Trémouilles, Marise Bafleur, Nicolas Nolhier, Philippe Perdu, André Touboul, Vincent Pouget, Dean Lewis

Microelectron. Reliab., 2005

Impact of semiconductors material on IR Laser Stimulation signal.

Abdellatif Firiti, Felix Beaudoin, Gérald Haller, Philippe Perdu, Dean Lewis, Pascal Fouillat

Microelectron. Reliab., 2005

Electrical Modeling for Laser Testing with Different Pulse Durations.

Alexandre Douin, Vincent Pouget, Dean Lewis, Pascal Fouillat, Philippe Perdu

Proceedings of the 11th IEEE International On-Line Testing Symposium (IOLTS 2005), 2005

2004

Time-resolved scanning of integrated circuits with a pulsed laser: application to transient fault injection in an ADC.

Vincent Pouget, Dean Lewis, Pascal Fouillat

IEEE Trans. Instrum. Meas., 2004

Light Emission From Small Technologies. Are Silicon Based Detectors Reaching Their Limits?

Mustapha Remmach, Romain Desplats, Philippe Perdu, J. P. Roux, Michel Vallet, Sylvain Dudit, P. Sardin, Dean Lewis

Microelectron. Reliab., 2004

Understanding the effects of NIR laser stimulation on NMOS transistor.

Abdellatif Firiti, Felix Beaudoin, Gérald Haller, Philippe Perdu, Dean Lewis, Pascal Fouillat

Microelectron. Reliab., 2004

Study of the ESD defects impact on ICs reliability.

Fabien Essely, Corinne Bestory, Nicolas Guitard, Marise Bafleur, A. Wislez, E. Doche, Philippe Perdu, André Touboul, Dean Lewis

Microelectron. Reliab., 2004

Investigation of SEU sensitivity of Xilinx Virtex II FPGA by pulsed laser fault injections.

Romain Desplats, S. Petit, Sana Rezgui, Carl Carmichael, Pascal Fouillat, Dean Lewis

Microelectron. Reliab., 2004

Time Resolved Photon Emission Processing Flow for IC Analysis.

Romain Desplats, Gaël Faggion, Mustapha Remmach, Felix Beaudoin, Philippe Perdu, Dean Lewis

Microelectron. Reliab., 2004

2003

Time Resolved Photoemission (PICA) - From the Physics to Practical Considerations.

Mustapha Remmach, Romain Desplats, Felix Beaudoin, E. Frances, Philippe Perdu, Dean Lewis

Microelectron. Reliab., 2003

Short defect characterization based on TCR parameter extraction.

Abdellatif Firiti, D. Faujour, Gérald Haller, J. M. Moragues, Vincent Goubier, Philippe Perdu, Felix Beaudoin, Dean Lewis

Microelectron. Reliab., 2003

From Static Thermal and Photoelectric Laser Stimulation (TLS/PLS) to Dynamic Laser Testing.

Felix Beaudoin, Romain Desplats, Philippe Perdu, Abdellatif Firiti, Gérald Haller, Vincent Pouget, Dean Lewis

Microelectron. Reliab., 2003

Characterization of ESD induced defects using Photovoltaic Laser Stimulation (PLS).

Thomas Beauchêne, David Trémouilles, Dean Lewis, Philippe Perdu, Pascal Fouillat

Microelectron. Reliab., 2003

A physical approach on SCOBIC investigation in VLSI.

Thomas Beauchêne, Dean Lewis, Felix Beaudoin, Vincent Pouget, Philippe Perdu, Pascal Fouillat, Yves Danto

Microelectron. Reliab., 2003

Thermal laser stimulation and NB-OBIC techniques applied to ESD defect localization.

Thomas Beauchêne, Dean Lewis, Felix Beaudoin, Vincent Pouget, Romain Desplats, Pascal Fouillat, Philippe Perdu, Marise Bafleur, David Trémouilles

Microelectron. Reliab., 2003

Application of Picosecond Ultrasonics to Non-Destructive Analysis in VLSI circuits.

G. Andriamonje, Vincent Pouget, Yves Ousten, Dean Lewis, Yves Danto, Jean-Michel Rampnoux, Younès Ezzahri, Stefan Dilhaire, Stéphane Grauby, Wilfrid Claeys

Microelectron. Reliab., 2003

2002

Backside Hot Spot Detection Using Liquid Crystal Microscopy.

Olivier Crépel, Felix Beaudoin, Lionel Dantas de Morais, Gérald Haller, C. Goupil, Philippe Perdu, Romain Desplats, Dean Lewis

Microelectron. Reliab., 2002

Reliability Defect Monitoring with Thermal Laser Stimulation: Biased Versus Unbiased.

Felix Beaudoin, Gérald Haller, Philippe Perdu, Romain Desplats, Thomas Beauchêne, Dean Lewis

Microelectron. Reliab., 2002

Backside Defect Localizations and Revelations Techniques on Gallium Arsenide (GaAs) Devices.

Felix Beaudoin, D. Carisetti, Romain Desplats, Philippe Perdu, Dean Lewis, J. C. Clement

Microelectron. Reliab., 2002

Dynamic Fault Injection in Integrated Circuits with a Pulsed Laser.

Dean Lewis, Pascal Fouillat, Vincent Pouget

Proceedings of the 3rd Latin American Test Workshop, 2002

2001

Theoretical Investigation of an Equivalent Laser LET.

Vincent Pouget, Hervé Lapuyade, Pascal Fouillat, Dean Lewis, S. Buchner

Microelectron. Reliab., 2001

Front Side and Backside OBIT Mappings applied to Single Event Transient Testing.

Dean Lewis, Vincent Pouget, Thomas Beauchêne, Hervé Lapuyade, Pascal Fouillat, André Touboul, Felix Beaudoin, Philippe Perdu

Microelectron. Reliab., 2001

Backside Localization of Current Leakage Faults Using Thermal Laser Stimulation.

Romain Desplats, Felix Beaudoin, Philippe Perdu, Patrick Poirier, David Trémouilles, Marise Bafleur, Dean Lewis

Microelectron. Reliab., 2001

Silicon Thinning and Polishing on Packaged Devices.

Felix Beaudoin, Philippe Perdu, Romain Desplats, Sebastien Rigo, Dean Lewis

Microelectron. Reliab., 2001

Modeling Thermal Laser Stimulation.

Felix Beaudoin, X. Chauffleur, Jean-Pierre Fradin, Philippe Perdu, Romain Desplats, Dean Lewis

Microelectron. Reliab., 2001

A New Laser System for X-Rays Flashes Sensitivity Evaluation.

Dean Lewis, Hervé Lapuyade, Yann Deval, Yvan Maidon, Frédéric Darracq, Renaud Briand, Pascal Fouillat

Proceedings of the 7th IEEE International On-Line Testing Workshop (IOLTW 2001), 2001

2000

An Overview of the Applications of a Pulsed Laser System for SEU Testing.

Vincent Pouget, Pascal Fouillat, Dean Lewis, Hervé Lapuyade, L. Sarger, F. M. Roche, S. Duzellier, R. Ecoffet

Proceedings of the 6th IEEE International On-Line Testing Workshop (IOLTW 2000), 2000