Pieter Schuddinck

According to our database1, Pieter Schuddinck authored at least 13 papers between 2014 and 2023.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

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PhD thesis 
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Links

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Bibliography

2023
PPA and Scaling Potential of Backside Power Options in N2 and A14 Nanosheet Technology.
Proceedings of the 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits), 2023

2022
Self-Heating in iN8-iN2 CMOS Logic Cells: Thermal Impact of Architecture (FinFET, Nanosheet, Forksheet and CFET) and Scaling Boosters.
Proceedings of the IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits 2022), 2022

PPAC of sheet-based CFET configurations for 4 track design with 16nm metal pitch.
Proceedings of the IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits 2022), 2022

Backside PDN and 2.5D MIMCAP to Double Boost 2D and 3D ICs IR-Drop beyond 2nm Node.
Proceedings of the IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits 2022), 2022

Design enablement of CFET devices for sub-2nm CMOS nodes.
Proceedings of the 2022 Design, Automation & Test in Europe Conference & Exhibition, 2022

2017
Dedicated technology threshold voltage tuning for 6T SRAM beyond N7.
Proceedings of the 2017 IEEE International Conference on IC Design and Technology, 2017

Device circuit and technology co-optimisation for FinFET based 6T SRAM cells beyond N7.
Proceedings of the 47th European Solid-State Device Research Conference, 2017

2016
5nm: Has the time for a device change come?
Proceedings of the 17th International Symposium on Quality Electronic Design, 2016

Memories for NTC.
Proceedings of the Near Threshold Computing, Technology, Methods and Applications., 2016

2015
Lateral NWFET optimization for beyond 7nm nodes.
Proceedings of the 2015 International Conference on IC Design & Technology, 2015

Dimensioning for power and performance under 10nm: The limits of FinFETs scaling.
Proceedings of the 2015 International Conference on IC Design & Technology, 2015

Holisitic device exploration for 7nm node.
Proceedings of the 2015 IEEE Custom Integrated Circuits Conference, 2015

2014


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