Yue Hao
Orcid: 0000-0002-8081-2919Affiliations:
- Xidian University, State Key Discipline Laboratory of Wide Bandgap Semiconductor Technology, School of Microelectronics, Xi'an, China
- Xi'an Jiao Tong University, China (PhD 1990)
According to our database1,
Yue Hao
authored at least 79 papers
between 2001 and 2025.
Collaborative distances:
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Bibliography
2025
A Novel Transform Accelerator With Fast Kernel Selection and Efficient Transform Circuit.
IEEE Trans. Circuits Syst. I Regul. Pap., June, 2025
Hardware Trojan Detection Methods for Gate-Level Netlists Based on Graph Neural Networks.
IEEE Trans. Computers, May, 2025
Corrections to "GNN-Based Hardware Trojan Detection at Register Transfer Level Leveraging Multiple-Category Features".
IEEE Trans. Very Large Scale Integr. Syst., March, 2025
GNN-Based Hardware Trojan Detection at Register Transfer Level Leveraging Multiple-Category Features.
IEEE Trans. Very Large Scale Integr. Syst., March, 2025
S4-KD: A single step spiking SiamFC+ + for object tracking with knowledge distillation.
Neural Networks, 2025
Study of GaN Schottky barrier IMPATT diodes with a self-aligned field plate for terahertz applications.
Microelectron. J., 2025
A comprehensive study on the electrical effects of avalanche region on GaN Schottky barrier IMPATT diodes through injection phases.
Microelectron. J., 2025
Class-F<sup>-1</sup> GaN Power Amplifier Integrated Active Antenna With Increased Efficiency for Wireless Power Transmission Applications.
IEEE Internet Things J., 2025
Sci. China Inf. Sci., 2025
Physics based circuit compatible model for hybrid antiferroelectric random access memory.
Sci. China Inf. Sci., 2025
Electro-optic tuning in ferroelectric capacitor with photonic crystal nanobeam cavity.
Sci. China Inf. Sci., 2025
Al2O3/AlN/GaN MOS-HEMTs on 6-inch silicon substrate with high transconductance and state-of-the-art fmax × LG.
Sci. China Inf. Sci., 2025
Sci. China Inf. Sci., 2025
High linearity GaN HEMT by optimized three-dimensional-gated modulation via top-MIS-gate nanowire channel structure.
Sci. China Inf. Sci., 2025
1.56 kV/30 A vertical β-Ga2O3 Schottky barrier diodes with composite edge terminations.
Sci. China Inf. Sci., 2025
2024
Judgmentally adjusted Q-values based on Q-ensemble for offline reinforcement learning.
Neural Comput. Appl., September, 2024
Effect of <sup>60</sup>Coγ ray radiation on electrical properties of SiGe HBTs at low temperatures.
Microelectron. J., February, 2024
Low-high-low doped Ga2O3 Schottky barrier IMPATT diodes on various crystal orientations for terahertz applications.
Microelectron. J., 2024
Sci. China Inf. Sci., 2024
Improved RF power performance via electrostatic shielding effect using AlGaN/GaN/graded-AlGaN/GaN double-channel structure.
Sci. China Inf. Sci., 2024
Sci. China Inf. Sci., 2024
Tunable lithium niobate metasurfaces for phase-only modulation based on quasi-bound states in the continuum.
Sci. China Inf. Sci., 2024
Performance improvement of β-Ga2O3 SBD-based rectifier with embedded microchannels in ceramic substrate.
Sci. China Inf. Sci., 2024
Sci. China Inf. Sci., 2024
High-voltage quasi-vertical GaN-on-Si Schottky barrier diode with edge termination structure of optimized multi-level N ion implantation.
Sci. China Inf. Sci., 2024
A novel multi-threshold coupling InAlN/GaN double-channel HEMT for improving transconductance flatness.
Sci. China Inf. Sci., 2024
Cascade and Extensible In-Memory Arithmetic Computing in 2T1R ReRAM Arrays Using Time-Sum-Logic Design.
IEEE Access, 2024
71 GHz-fmax β-Ga2O3-on-SiC RF Power MOSFETs with Record Pout=3.1 W/mm and PAE=50.8% at 2 GHz, Pout= 2.3 W/mm at 4 GHz, and Low Microwave Noise Figure.
Proceedings of the IEEE Symposium on VLSI Technology and Circuits 2024, 2024
Proceedings of the IEEE Region 10 Conference, 2024
2023
A compact model of DC <i>I</i>-<i>V</i> characteristics for depleted Ga<sub>2</sub>O<sub>3</sub> MOSFETs.
Microelectron. J., October, 2023
2.29-kV GaN-based double-channel Schottky barrier diodes on Si substrates with high VON uniformity.
Sci. China Inf. Sci., June, 2023
1.7 kV normally-off p-GaN gate high-electron-mobility transistors on a semi-insulating SiC substrate.
Sci. China Inf. Sci., February, 2023
Degradation induced by holes in Si3N4/AlGaN/GaN MIS HEMTs under off-state stress with UV light.
Sci. China Inf. Sci., February, 2023
Ga2O3 Heterojunction PN Diodes with Suppressed Background Carrier Concentration for Improved Breakdown Voltage.
Proceedings of the Device Research Conference, 2023
2022
Neuromorph. Comput. Eng., December, 2022
A Broadband Amplifier With Flat Bandwidth for Modulator and Measurement Driver Circuits.
IEEE Trans. Instrum. Meas., 2022
Hardware-algorithm collaborative computing with photonic spiking neuron chip based on integrated Fabry-Pérot laser with saturable absorber.
CoRR, 2022
Design and simulation of reverse-blocking Schottky-drain AlN/AlGaN HEMTs with drain field plate.
Sci. China Inf. Sci., 2022
Sci. China Inf. Sci., 2022
Sci. China Inf. Sci., 2022
Experimental demonstration of photonic spike-timing-dependent plasticity based on a VCSOA.
Sci. China Inf. Sci., 2022
Improved transport properties and mechanism in recessed-gate InAlN/GaN HEMTs using a self-limited surface restoration method.
Sci. China Inf. Sci., 2022
Controlling Memristance and Negative Differential Resistance in Point-Contacted Metal-Oxides-Metal Heterojunctions: Role of Oxygen Vacancy Electromigration and Electron Hopping.
Adv. Intell. Syst., 2022
A Novel Concept of using Double Threshold Voltage Coupling to Improve the linearity of AlGaN/GaN HEMTs for millimeter-wave applications.
Proceedings of the 2022 IEEE International Conference on Integrated Circuits, 2022
First Demonstration of High PAE Performance Using InGaN Channel HEMT for 5G RF Applications.
Proceedings of the 2022 IEEE International Conference on Integrated Circuits, 2022
Systematic Study on Positive Bias Temperature Instability(PBTI) of ZrO2-based Ge nMOSFETs with Interlayer Passivations.
Proceedings of the International Conference on IC Design and Technology, 2022
2021
Computing Primitive of Fully VCSEL-Based All-Optical Spiking Neural Network for Supervised Learning and Pattern Classification.
IEEE Trans. Neural Networks Learn. Syst., 2021
A modified supervised learning rule for training a photonic spiking neural network to recognize digital patterns.
Sci. China Inf. Sci., 2021
Sci. China Inf. Sci., 2021
Novel Selective Area Recessed Regrowth-free Ohmic Contacts to High Al-content Barrier.
Proceedings of the 2021 IEEE International Conference on Integrated Circuits, 2021
All-Inorganic Two-Dimensional Ruddlesden-Popper Perovskite Cs2PbI2Cl2 Nanosheet Films for Self-Powered, Visible-Blind UV Photodetectors.
Proceedings of the 14th IEEE International Conference on ASIC, 2021
2020
Lateral GaN Schottky Barrier Diode for Wireless High-Power Transfer Application With High RF/DC Conversion Efficiency: From Circuit Construction and Device Technologies to System Demonstration.
IEEE Trans. Ind. Electron., 2020
Real-time optical spike-timing dependent plasticity in a single VCSEL with dual-polarized pulsed optical injection.
Sci. China Inf. Sci., 2020
Enhanced memory capacity of a neuromorphic reservoir computing system based on a VCSEL with double optical feedbacks.
Sci. China Inf. Sci., 2020
Investigation of Inverse Piezoelectric Effect and Trap Effect in AlGaN/GaN HEMTs Under Reverse-Bias Step Stress at Cryogenic Temperature.
IEEE Access, 2020
Normally-Off Hydrogen-Terminated Diamond Field Effect Transistor With Ferroelectric HfZrO<sub>x</sub>/Al<sub>2</sub>O<sub>3</sub> Gate Dielectrics.
IEEE Access, 2020
Low On-Resistance H-Diamond MOSFETs With 300 °C ALD-Al<sub>2</sub>O<sub>3</sub> Gate Dielectric.
IEEE Access, 2020
IEEE Access, 2020
Hardware Architecture and Algorithm Co-Design for Multi-Layer Photonic Neuromorphic Network with Excitable VCSELs-SA.
Proceedings of the Optical Fiber Communications Conference and Exhibition, 2020
Evolution of Defect in AlGaN-based Deep Ultraviolet Light Emitting Diodes During Electrical Stress.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020
2018
Threshold voltage shift and interface/border trapping mechanism in Al2O3/AlGaN/GaN MOS-HEMTs.
Proceedings of the IEEE International Reliability Physics Symposium, 2018
2016
IEICE Electron. Express, 2016
2015
J. Signal Process. Syst., 2015
IEICE Electron. Express, 2015
IEICE Electron. Express, 2015
AlGaN channel MIS-HEMTs with a very high breakdown electric field and excellent high-temperature performance.
IEICE Electron. Express, 2015
2014
Reliability investigation of AlGaN/GaN high electron mobility transistors under reverse-bias stress.
Microelectron. Reliab., 2014
Novel silicon-controlled rectifier (SCR) for digital and high-voltage ESD power supply clamp.
Sci. China Inf. Sci., 2014
2013
Erratum: The impact of trapping centers on AlGaN/GaN resonant tunneling diode [IEICE Electronics Express Vol 10 (2013) No 19 pp 20130588].
IEICE Electron. Express, 2013
IEICE Electron. Express, 2013
2010
Sci. China Inf. Sci., 2010
2008
The mobility of two-dimensional electron gas in AlGaN/GaN heterostructures with varied Al content.
Sci. China Ser. F Inf. Sci., 2008
2005
Efficient parametric yield optimization of VLSI circuit by uniform design sampling method.
Microelectron. Reliab., 2005
Proceedings of the Computational Intelligence and Security, International Conference, 2005
2003
Reliability Estimation Model of ICs Interconnect Based on Uniform Distribution of Defects on a Chip.
Proceedings of the 18th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2003), 2003
2001
Relation between Reliability and Yield of IC's Based on Discrete Defect Distribution Model.
Proceedings of the 16th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2001), 2001