Alexander Grill

According to our database, Alexander Grill authored at least 19 papers between 2019 and 2025.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2025

CV Characterization of Si/SiGe Heterostructures at Cryo Temperatures.

F. Stampfl, Clement Godfrin, Stefan Kubicek, S. Baudot, B. Raes, Kristiaan De Greve, Alexander Grill, M. Waltl

Proceedings of the IEEE International Reliability Physics Symposium, 2025

Advanced RTN Analysis on 3D NAND Trench Devices Using Physics-Informed Machine Learning Framework.

Yusuke Higashi, Anirudh Varanasi, Philippe J. Roussel, Pablo Saraza-Canflanca, J. P. Bastos, Alexander Grill, E. Catapano, R. Asanovski, Jacopo Franco, Ben Kaczer, Adrian Chasin, Devin Verreck, S. Ramesh, Laurent Breuil, Antonio Arreghini, S. Rachidi, Y. Jeong, Geert Van den Bosch, Maarten Rosmeulen, Robin Degraeve

Proceedings of the IEEE International Reliability Physics Symposium, 2025

Investigation of Cryogenic Aging in 28 nm CMOS: Suppression of BTI and HCD in Circuits and SRAM.

Javier Diaz-Fortuny, Mahdi Benkhelifa, Alexander Grill, Erik Bury, Robin Degraeve, Ben Kaczer, Hussam Amrouch

Proceedings of the IEEE International Reliability Physics Symposium, 2025

Impact of Gate Metal Work Function on 1/f Noise in RMG MOSFETs.

R. Asanovski, Hiroaki Arimura, J. Ganguly, Pierpaolo Palestri, Alexander Grill, Ben Kaczer, Naoto Horiguchi, Luca Selmi, Jacopo Franco

Proceedings of the IEEE International Reliability Physics Symposium, 2025

2024

Insight into Latchup Risk in 28nm Planar Bulk Technology for Quantum Computing Applications.

Kateryna Serbulova, Zi-En Qiu, Shih-Hung Chen, Alexander Grill, Kuo-Hsing Kao, Jo De Boeck, Guido Groeseneken

Proceedings of the IEEE International Reliability Physics Symposium, 2024

2023

Wafer-Scale Electrical Characterization of Silicon Quantum Dots from Room to Low Temperatures.

Francesco Lorenzelli, Asser Elsayed, Clement Godfrin, Alexander Grill, Stefan Kubicek, Ruoyu Li, Michele Stucchi, Danny Wan, Kristiaan De Greve, Erik Jan Marinissen, Georges G. E. Gielen

Proceedings of the IEEE International Test Conference, 2023

Study of Transistor Metrics for Room-Temperature Screening of Single Electron Transistors for Silicon Spin Qubit Applications.

Francesco Lorenzelli, Asser Elsayed, Clement Godfrin, Alexander Grill, Stefan Kubicek, Ruoyu Li, Michele Stucchi, Danny Wan, Kristiaan De Greve, Erik Jan Marinissen, Georges G. E. Gielen

Proceedings of the IEEE European Test Symposium, 2023

2022

Scalable 1.4 μW cryo-CMOS SP4T multiplexer operating at 10 mK for high-fidelity superconducting qubit measurements.

Rohith Acharya, Anton Potocnik, Steven Brebels, Alexander Grill, Jeroen Verjauw, Tsvetan Ivanov, Daniel Perez Lozano, Danny Wan, Fahd A. Mohiyaddin, Jacques Van Damme, A. M. Vadiraj, Massimo Mongillo, Georges G. E. Gielen, Francky Catthoor, Jan Craninckx, Iuliana P. Radu, Bogdan Govoreanu

Proceedings of the IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits 2022), 2022

Understanding and Modeling Opposite Impacts of Self-Heating on Hot-Carrier Degradation in n- and p-Channel Transistors.

Stanislav Tyaginov, Alexander Makarov, Al-Moatasem Bellah El-Sayed, Adrian Vaisman Chasin, Erik Bury, Markus Jech, Michiel Vandemaele, Alexander Grill, An De Keersgieter, Mikhail I. Vexler, Geert Eneman, Ben Kaczer

Proceedings of the IEEE International Reliability Physics Symposium, 2022

On Superior Hot Carrier Robustness of Dynamically-Doped Field-Effect-Transistors.

Stanislav Tyaginov, Aryan Afzalian, Alexander Makarov, Alexander Grill, Michiel Vandemaele, Maksim Cherenev, Mikhail I. Vexler, Geert Hellings, Ben Kaczer

Proceedings of the IEEE International Reliability Physics Symposium, 2022

Modelling ultra-fast threshold voltage instabilities in Hf-based ferroelectrics.

Barry J. O'Sullivan, Brecht Truijen, Vamsi Putcha, Alexander Grill, Adrian Vaisman Chasin, Geert Van den Bosch, Ben Kaczer, Md Nur K. Alam, Jan Van Houdt

Proceedings of the IEEE International Reliability Physics Symposium, 2022

Significant Enhancement of HCD and TDDB in CMOS FETs by Mechanical Stress.

Kookjin Lee, Ben Kaczer, Anastasiia Kruv, Mario Gonzalez, Geert Eneman, Oguzhan O. Okudur, Alexander Grill, Jacopo Franco, Andrea Vici, Robin Degraeve, Ingrid De Wolf

Proceedings of the IEEE International Reliability Physics Symposium, 2022

Temperature Dependent Mismatch and Variability in a Cryo-CMOS Array with 30k Transistors.

Alexander Grill, V. John, Jakob Michl, A. Beckers, Erik Bury, Stanislav Tyaginov, Bertrand Parvais, Adrian Vaisman Chasin, Tibor Grasser, Michael Waltl, Ben Kaczer, Bogdan Govoreanu

Proceedings of the IEEE International Reliability Physics Symposium, 2022

2021

Solid state qubits: how learning from CMOS fabrication can speed-up progress in Quantum Computing.

Iuliana P. Radu, Roy Li, Anton Potocnik, Tsvetan Ivanov, Danny Wan, Stefan Kubicek, Nard I. Dumoulin Stuyck, Jeroen Verjauw, Julien Jussot, Yann Canvel, Clement Godfrin, Massimo Mongillo, Rohith Acharya, Asser Elsayed, Mohamed Shehata, Xiaoyu Piao, Antoine Pacco, Laurent Souriau, Sebastien Couet, B. T. Chan, Jan Craninckx, Bertrand Parvais, Alexander Grill, Subramanian Narasimhamoorthy, Steven Van Winckel, Steven Brebels, Fahd A. Mohiyaddin, George Simion, Bogdan Govoreanu

Proceedings of the 2021 Symposium on VLSI Circuits, Kyoto, Japan, June 13-19, 2021, 2021

2020

A Compact Physics Analytical Model for Hot-Carrier Degradation.

Stanislav Tyaginov, Alexander Grill, Michiel Vandemaele, Tibor Grasser, Geert Hellings, Alexander Makarov, Markus Jech, Dimitri Linten, Ben Kaczer

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

Quantum Mechanical Charge Trap Modeling to Explain BTI at Cryogenic Temperatures.

Jakob Michl, Alexander Grill, Dieter Claes, Gerhard Rzepa, Ben Kaczer, Dimitri Linten, Iuliana P. Radu, Tibor Grasser, Michael Waltl

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

On the impact of mechanical stress on gate oxide trapping.

Anastasiia Kruv, Ben Kaczer, Alexander Grill, Mario Gonzalez, Jacopo Franco, Dimitri Linten, Wolfgang Goes, Tibor Grasser, Ingrid De Wolf

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

Reliability and Variability of Advanced CMOS Devices at Cryogenic Temperatures.

Alexander Grill, Erik Bury, Jakob Michl, Stanislav Tyaginov, Dimitri Linten, Tibor Grasser, Bertrand Parvais, Ben Kaczer, Michael Waltl, Iuliana P. Radu

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

2019

Modeling the Effect of Random Dopants on Hot-Carrier Degradation in FinFETs.

Alexander Makarov, Ben Kaczer, Philippe Roussel, Adrian Vaisman Chasin, Alexander Grill, Michiel Vandemaele, Geert Hellings, Al-Moatasem El-Sayed, Tibor Grasser, Dimitri Linten, Stanislav Tyaginov

Proceedings of the IEEE International Reliability Physics Symposium, 2019